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Photonics Source provides 152 products. Download datasheets, request quotes, and compare function, price, and availability.
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Benchtop Thin-Film Thickness Analyzer (Spectroscopic Reflectometer)
Measurement Principle: Spectral reflectance Thickness Measurement Range: 15Å–70µm Wavelength Range: 380–1050nm Thickness Accuracy: ±0.4% Repeatability (1σ): ≤0.1% -
Filmetrics F3-CS Compact Thin-Film Thickness Measurement System
Measurement Principle: Spectral Reflectance Film Thickness Range: 15nm-75μm Wavelength Range: 380-1050nm Light Source: Tungsten-Halogen Lamp Spectrometer Detector: CCD Array -
TITAN™ Probe Series
Characteristic Impedance: 50Ω Frequency Range: DC to 220GHz Insertion Loss (dB): <5 Return Loss (dB): ≥9 Tip End Return Loss (dB): ≥13 -
TITAN™ Probe Family DC to 145 GHz
Characteristic Impedance: 50Ω Connector Type: 0.8mm, female Tip Material: Ni alloy Contact Footprint Width: 15μm Maximal Voltage: ≤50V -
TS3500-SE
Chuck XY Stage Travel Range: 310mm×530mm Resolution: 0.0001° (0.24μm @ 300mm edge) Accuracy: <2.0μm Repeatability: <1.0μm XY Stage Drive: Closed-loop high precision stepper motors -
MPI TS200-HP
Probe Station Dimensions: 900×1050×1930mm Weight: ~500kg Chuck XY Stage Travel Range: 225×260mm Fine Travel Range: 25×25mm Fine Travel Resolution: <1.0μm@500μm/rev -
Unknown
Number of Wires: Multiple Connection Type: High-density Operating Temperature: -40°C to +85°C Insertion Loss: Low Fiber Type: Single-mode/multi-mode -
TS150 Manual Probe System
Total Travel Range: 180x230mm (7.1x9.1in) Fine Travel Range: 25x25mm fine micrometer control Fine Travel Resolution: <1.0μm (0.04mils)@500μm/rev Planarity: <10μm Theta Travel (Standard): 360° -
YB-IV-Smart Auto Curve Tracer
Max Current Source: 10mA Voltage Range: 0.01V-9V Diode Low Limit: 0.01V Diode High Limit: 9V Clamping Voltage: Diode High Limit+0.5V -
Filmetrics R54 Series
Maximum Sample Height: 15mm Maximum Sample Stage Load: 2.5kg Resistivity: 1mΩ/sq-200mΩ/sq (4PP), 1mΩ/sq-50mΩ/sq (EC) Accuracy: <0.2% (4PP), <1% (EC) Repeatability: <0.02% (4PP), <0.2% (EC) -
HED-C5000R
Model: HED-C5000R Test Model: ESDA, JEDEC JS-002(AEC), JEITA Test Capability: 1024 Pins or Higher Test voltage: 0 to +/-4000V Step Voltage: 5V -
Auriga AU5 Pulsed IV/RF Characterization System
Max Voltage PHG20: ±20V Max Voltage PHG100: ±100V Max Voltage PHD220-2: 220V Max Voltage PHD220-10: 220V Max Voltage PHD220-30: 220V -
Chixiao - Transient Thermal Tester CX-30A10V4P
Test Modes: DIODE模式, SAT模式, IGBT模式, RDSON模式 Compatible Devices: DIODES Compatible Devices: MOSFETs Compatible Devices: IGBTs Compatible Devices: HEMTs -
Auriga AU5 Pulsed IV System
Max Voltage PHG20: ±20V Max Voltage PHG100: ±100V Max Voltage PHD220-2: 220V Max Voltage PHD220-10: 220V Max Voltage PHD220-30: 220V -
UniDRON
Laser Wavelength Selection: 266/325/355/457/473/514/532/633/670/785/808/830/1064/1350nm Microscope & Objective Lens Selection: 10x, 20x, 50x, 100x Laser Excitation Fiberless System: Available 11-Level Power Adjustment: 0.01%-100% High-Resolution Imaging and Spectroscopy: XY: 50μm, Z: 10nm -
Zeta-388 Optical Profiler
Optical Resolution: 5MP Sample Size Range: 45×35μm to 9.5×7.5mm Film Thickness Range: 30nm to 100μm Step Height Measurement Range: up to 250nm Stage Size: 200mm motorized XY stage -
Tencor P-170 Stylus Profiler
Scan Length: ≤200mm Vertical Range: ≤1mm Force Control Range: 0.03g-50g Sample Size Range: 75mm-200mm Video Resolution: 5MP -
Zeta-300
Scanning Range: 280μm Sample Stage Size: 150×150mm, 200×200mm, 300×300mm Imaging Resolution: 5MP Light Source: 405nm LED Measurement Sensitivity: >1μm -
FS-Pro High-Performance Parametric Test System
Wide Range: 200V电压,1A直流电流 Built-in Pulse Test: 200V电压,3A脉冲电流,小至50us脉宽 High-Speed Time Domain Signal Acquisition: 采样时间小于1us,高达10万点数据 High Precision: 30fA精度,0.1fA灵敏度 Noise Test Speed: <10s/bias(大于0.5Hz频率分辨率) -
CobaltFx FEV Series
Dimensions: 220mm×105mm×80mm Weight: 3.5kg Operating Frequency FEV-15: 50GHz-75GHz Dynamic Range FEV-15: 110dB min., 120dB typ. Operating Frequency FEV-12: 60GHz-90GHz