Zeta-388 Optical Profiler
The Zeta-388 optical profiler is a non-contact, 3D surface topography measurement system designed for automated defect inspection and precise measurements of step heights, roughness, and film thickness. It features ZDot™ technology and multi-mode optics for high-resolution imaging.
Specification Snapshot
Sample Size Range
45×35μm to 9.5×7.5mm
Stage Size
200mm motorized XY stage
Sample Loading
100, 150, and 200mm wafers
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Overview
The Zeta-388 optical profiler is a non-contact, 3D surface topography measurement system designed for automated defect inspection and precise measurements of step heights, roughness, and film thickness. It features ZDot™ technology and multi-mode optics for high-resolution imaging.
Specifications
| Parameter | Value |
|---|---|
| Optical Resolution | 5MP |
| Sample Size Range | 45×35μm to 9.5×7.5mm |
| Film Thickness Range | 30nm to 100μm |
| Step Height Measurement Range | up to 250nm |
| Stage Size | 200mm motorized XY stage |
| Scanning Modes | Brightfield, darkfield, differential image contrast (DIC) |
| Autofocus | Enabled |
| Light Source Type | Broadband white light or 405nm monochromatic LED |
| Sample Loading | 100, 150, and 200mm wafers |
| Vibration Isolation | Built-in vibration isolation and acoustic enclosure |
Applications
1. Step heights from nanometers to millimeters, including high aspect ratio 2. Roughness of smooth (sub-nanometer) and rough (hundreds of microns) surfaces 3. White light interferometry for wide area step height measurements with high z resolution 4. Phase scanning interferometry for fast measurement of step heights up to 250nm 5. Thin film stress and sample bow 6. Transparent film thickness from 30nm to 100μm with film thickness mapping 7. Automated defect inspection with sensitivity for defects >1μm (lateral dimension)
Key Features
1. Fast, non-contact, 3D optical profiler 2. Multi-mode optics supporting 3D scanning, interference contrast, film thickness, and automated defect inspection 3. Fully automated measurements 4. Simultaneous 3D scan and True Color infinite focus image capture 5. Configurable for wafers from 100 to 200mm 6. OCR and SECS/GEM support for use in production fabrication environments 7. Intuitive user interface
Datasheet
Product Datasheet
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Supplier Information
<p>Yingbo Scientific Instruments (Shanghai) Co., Ltd. is an enterprise focused on providing comprehensive solutions for semiconductor wafer-level testing systems, micro-nano science and other fields. It mainly provides advanced semiconductor testing systems and micro-nano scientific instruments and equipment to universities, scientific research institutes and enterprises and institutions, and is committed to bringing scientific research products with market prospects to the market.</p><p><br></p><p><br></p><p> At present, the company has become one of the few domestic companies that provides professional scientific instruments such as semiconductor wafer-level testing systems and micro-nano processing. In the fields of semiconductor wafer-level testing system solutions, micro-nano processing equipment, micro-nano characterization equipment, micro-nano field consumables, micro-nano processing and testing, micro-nano peripheral products and other related fields, the company has an experienced and highly skilled team that can excellently complete all-round services before, during and after sales. The company is headquartered in Shanghai, and has offices in Beijing and Shenzhen. It has established 8 after-sales service outlets in Wuhan, Xi'an, Chengdu, Hefei, Shenyang, Nanjing, Xiamen, Xuzhou and other places. The outlets across the country provide customers with a large number of high-quality equipment and after-sales services, and have won a good reputation and reputation in the semiconductor technology service industry.</p><p><br></p><p> The company adheres to the value concepts of innovation, integrity, professionalism and efficiency, and provides high-quality equipment and technical services to partners. In the future, the company will continue to recommend the introduction of innovative and efficient product instruments and contribute a small amount to the development of the motherland's semiconductor science industry!</p>
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