Auriga AU5 Pulsed IV/RF Characterization System

Auriga AU5 Pulsed IV/RF Characterization System

Supplier
Ybsemi-Solution
Part Number
Auriga AU5 Pulsed IV/RF Characterization System
Category
Other
Origin
China

The Auriga AU5 Pulsed IV/RF Characterization System is a cutting-edge solution for capturing current-voltage characteristics of active devices such as FETs and BJTs. It offers unparalleled performance, speed, and accuracy, making it ideal for high-power devices like GaN HEMTs, LDMOS, SiC, and graphene transistors.

Specification Snapshot
Max Voltage PHD220-2
220V
Max Voltage PHD220-10
220V
Max Voltage PHD220-30
220V
Max Voltage PHD600-5
600V
Max Voltage PHD1200-10
1200V
Max Voltage PHD1200-100
1200V
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Overview

The Auriga AU5 Pulsed IV/RF Characterization System is a cutting-edge solution for capturing current-voltage characteristics of active devices such as FETs and BJTs. It offers unparalleled performance, speed, and accuracy, making it ideal for high-power devices like GaN HEMTs, LDMOS, SiC, and graphene transistors.

Specifications

ParameterValue
Max Voltage PHG20±20V
Max Voltage PHG100±100V
Max Voltage PHD220-2220V
Max Voltage PHD220-10220V
Max Voltage PHD220-30220V
Max Voltage PHD600-5600V
Max Voltage PHD1200-101200V
Max Voltage PHD1200-1001200V
Max Current Pulsed PHG20±0.1A
Max Current Pulsed PHG100±2A
Max Current Pulsed PHD220-210A
Max Current Pulsed PHD220-1030A
Max Current Pulsed PHD220-3050A
Max Current Pulsed PHD600-55A
Max Current Pulsed PHD1200-1010A
Max Current Pulsed PHD1200-100100A
Max Current DC PHG20±0.1A
Max Current DC PHG100±0.5A
Max Current DC PHD220-20.75A
Max Current DC PHD220-102.5A
Max Current DC PHD220-302.5A
Max Current DC PHD600-5±2mA
Max Current DC PHD1200-100.1A
Max Current DC PHD1200-1000.1A
Max Error PHG200.1%
Max Error PHG1000.1%
Max Error PHD220-20.1%
Max Error PHD220-100.1%
Max Error PHD220-300.1%
Max Error PHD600-5±2mA
Max Error PHD1200-100.01%
Max Error PHD1200-1000.01%
Max Power PHG2020W
Max Power PHG10040W
Max Power PHD220-2100W
Max Power PHD220-101000W
Max Power PHD220-301000W
Max Power PHD600-51000W
Max Power PHD1200-101000W
Max Power PHD1200-1005000W
Min Pulse Width PHG20200ns
Min Pulse Width PHG100200ns
Min Pulse Width PHD220-2200ns
Min Pulse Width PHD220-10500ns
Min Pulse Width PHD220-30500ns
Min Pulse Width PHD600-5500ns
Min Pulse Width PHD1200-10750ns
Min Pulse Width PHD1200-100750ns
Max Pulse Repetition Frequency (PRF) PHG20310kHz@V≤20V
Max Pulse Repetition Frequency (PRF) PHG100310kHz@V≤100V
Max Pulse Repetition Frequency (PRF) PHD220-2155kHz@V≤160V
Max Pulse Repetition Frequency (PRF) PHD220-1050kHz@V≤220V
Max Pulse Repetition Frequency (PRF) PHD220-3050kHz@V≤220V
Max Pulse Repetition Frequency (PRF) PHD600-520kHz@V≤600V
Max Pulse Repetition Frequency (PRF) PHD1200-105kHz@V≤1200V
Max Pulse Repetition Frequency (PRF) PHD1200-1005kHz@V≤1200V
Max Duty Cycle PHG20100% @I≤0.1A
Max Duty Cycle PHG1005%@I≤2A, 35%@I≤1.5A, 70%@I≤0.75A
Max Duty Cycle PHD220-25%@I≤10A
Max Duty Cycle PHD220-105%@I≤30A
Max Duty Cycle PHD220-305%@I≤50A
Min Output Rise/Fall PHG2023ns@20V
Min Output Rise/Fall PHG10026ns@100V
Min Output Rise/Fall PHD220-236ns@220V
Min Output Rise/Fall PHD220-1036ns@220V
Min Output Rise/Fall PHD220-3036ns@220V
Min Output Rise/Fall PHD600-535ns@600V
Min Output Rise/Fall PHD1200-1076ns@1200V
Min Output Rise/Fall PHD1200-10076ns@1200V
Test Port Connector PHG20BNC(f)
Test Port Connector PHG100BNC(f)
Test Port Connector PHD220-2BNC(f)
Test Port Connector PHD220-10BNC(f)
Test Port Connector PHD220-30BNC(f)
Test Port Connector PHD600-5BNC(f)
Test Port Connector PHD1200-10MHV(f)
Test Port Connector PHD1200-100MHV(f)

Applications

1. Semiconductor device testing 2. High-power transistor characterization 3. Research and development in RF and microwave technologies 4. Compact modeling for RF design

Key Features

1. High-speed and accurate current-voltage measurements 2. Supports high-power devices like GaN HEMTs, LDMOS, and SiC 3. Integrated software for streamlined setup and real-time results 4. Optional features for compact modeling and RF measurements 5. Advanced triggering capabilities for precise measurements

Datasheet

Product Datasheet
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Supplier Information

Yb
Ybsemi-Solution
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<p>Yingbo Scientific Instruments (Shanghai) Co., Ltd. is an enterprise focused on providing comprehensive solutions for semiconductor wafer-level testing systems, micro-nano science and other fields. It mainly provides advanced semiconductor testing systems and micro-nano scientific instruments and equipment to universities, scientific research institutes and enterprises and institutions, and is committed to bringing scientific research products with market prospects to the market.</p><p><br></p><p><br></p><p> &nbsp; &nbsp; &nbsp; At present, the company has become one of the few domestic companies that provides professional scientific instruments such as semiconductor wafer-level testing systems and micro-nano processing. In the fields of semiconductor wafer-level testing system solutions, micro-nano processing equipment, micro-nano characterization equipment, micro-nano field consumables, micro-nano processing and testing, micro-nano peripheral products and other related fields, the company has an experienced and highly skilled team that can excellently complete all-round services before, during and after sales. The company is headquartered in Shanghai, and has offices in Beijing and Shenzhen. It has established 8 after-sales service outlets in Wuhan, Xi'an, Chengdu, Hefei, Shenyang, Nanjing, Xiamen, Xuzhou and other places. The outlets across the country provide customers with a large number of high-quality equipment and after-sales services, and have won a good reputation and reputation in the semiconductor technology service industry.</p><p><br></p><p> &nbsp; &nbsp; &nbsp; The company adheres to the value concepts of innovation, integrity, professionalism and efficiency, and provides high-quality equipment and technical services to partners. In the future, the company will continue to recommend the introduction of innovative and efficient product instruments and contribute a small amount to the development of the motherland's semiconductor science industry!</p>

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