DWDM Parallel Scanning 1-to-4 Test System
Product Function Introduction 1. Supports scanning and PDL testing of different types of DWDM/AWG modules (devices) and 100G Lan WDM devices, with flexible parameter settings, visual interface and very simple operation. 2. Supports real-time parallel shared scanning testing of tunable light sources by multiple stations, with no interference between stations and no queuing. 3. Automatically calculates ITU IL, Min IL, Max IL, IL uniformity, Ripple, PDL, CWL (0.5dB, 1dB, 3dB, etc.), the offset between the center wavelength and the ITU wavelength, Bandwidth, Isolation, Crosstalk and other parameters. 4. Automatically analyzes and calculates various required test parameter results, automatically judges test results; all data is stored in bulk and shipping reports are automatically generated. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators ITU IL/Min IL/Max IL/PDL/Ripple/TDL/CWL/Bandwidth/Isolation Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) Measurement mode TLS scan/single power meter point test Single-channel scan time 6-10 S Single-point PDL pure test time 3-5 S Solution configuration No. Name, specification and description Remarks 1 Tunable light source, supporting various brands of tunable light sources (with scanning function) 2 High-speed power meter 3 Optical switch: 1X2, 1X4 mechanical test-grade optical switch Repeatability ≤0.01dB 4 Polarization controller: GM8015-C, GT303-5 5 Test system optical path host Custom Test industrial computer GPIB card, GPIB cable: PCI-GPIB, GPIB-US-HS
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Overview
Specifications
| Parameter | Value |
|---|---|
| Remarks | Repeatability ≤0.01dB |
| Test Specifications | ITU IL/Min IL/Max IL/PDL/Ripple/TDL/CWL/Bandwidth/Isolation |
| Insertion Loss (IL) Uncertainty | ±0.05 (fusion splice test); ±0.1 (connector test) |
| Single-Channel Scan Time | 6-10s |
| Single-Point PDL Pure Measurement Time | 3-5s |
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