CWDM 1-to-4 Scanning Test System
Product Function Introduction 1. Fully utilizes the low utilization rate of broadband light sources and spectrum analyzers to realize sharing of broadband sources and spectrometers, allowing four test stations to perform tests in time division multiplexing. 2. Compatible with CWDM device and module scan testing. Supports high/low temperature testing with automatic time delay control for heating and cooling. 3. Automatically scans and calculates ITU IL, Min IL, Max IL, Ripple, TDL, Isolation, and CWL, Bandwidth and other parameters under different dB value conditions. 4. Compatible with complex CWDM module scan testing and calculation, such as WDM modules mixing EXP, UPG, Coupler devices and Monitor channels, or special modules combining multiple modules such as MUX/DEMUX and TX/RX. 5. Automatically judges test results; all data is stored in bulk in the SQL Server database, and shipping reports are automatically generated in batches. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators IL/Ripple/ADJ/NADJ/CWL/BW//TDL, etc. Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) Measurement mode OSW scan Single-channel scan time 6-8 (AQ6370, 1250~1650nm, step 0.1nm) S Measurable product types CWDM devices, CWDM modules, FWDM Solution configuration: No. Name, specification and description Remarks 1 Broadband light source 1250~1650nm 2 Spectrum analyzer AQ6370, Agilent86142B, etc. 3 Optical switch: 1X2, 1X4, 1X18 mechanical test-grade optical switch Repeatability ≤0.01dB 4 Test industrial computer 5 GPIB card GPIB-USB-HS
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test Specifications | IL/Ripple/ADJ/NADJ/CWL/BW//TDL,etc. |
| Insertion Loss (IL) Uncertainty | ±0.05 (fusion splice test); ±0.1 (connector test) |
| Measurable Product Types | CWDM device; CWDM module; FWDM |
Datasheet
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