futureC Semiconductor Wafer Testing System Integration Software
futureC is a unified hardware communication and testing platform developed by EOULU, designed for semiconductor wafer testing and operation systems. It supports all programmable control devices and provides efficient testing solutions.
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Overview
futureC is a unified hardware communication and testing platform developed by EOULU, designed for semiconductor wafer testing and operation systems. It supports all programmable control devices and provides efficient testing solutions.
Specifications
| Parameter | Value |
|---|---|
| File Read/Write Speed | 0.003s/1000行 |
| Instrument IO Speed | 85ms/次 |
| 2Port-S Parameter | 201点,IFBW=10KHz |
| DC Scanning | 3.9s/50point |
| Operating System | Win10, Win11 |
| Processor | Intel 酷睿i3 四核3.6GHz |
| Graphics Card | 独立显卡1G |
| Memory | 8GB运行内存 |
| Hard Disk | 500GHz |
| Display Resolution | 1920×1080 |
Applications
1. Semiconductor wafer testing 2. Automated factory testing 3. Data storage and analysis
Key Features
1. High-speed mapping and centralized control 2. SECS/GEM module for factory automation 3. Supports real-time data storage and interruption testing
Datasheet
Product Datasheet
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Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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