futureC Semiconductor Wafer Testing System Integration Software

futureC Semiconductor Wafer Testing System Integration Software

Supplier
Eoulu
Part Number
futureC Semiconductor Wafer Testing System Integration Software
Category
Probe Station
Origin
China

futureC is a unified hardware communication and testing platform developed by EOULU, designed for semiconductor wafer testing and operation systems. It supports all programmable control devices and provides efficient testing solutions.

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Overview

futureC is a unified hardware communication and testing platform developed by EOULU, designed for semiconductor wafer testing and operation systems. It supports all programmable control devices and provides efficient testing solutions.

Specifications

ParameterValue
File Read/Write Speed0.003s/1000行
Instrument IO Speed85ms/次
2Port-S Parameter201点,IFBW=10KHz
DC Scanning3.9s/50point
Operating SystemWin10, Win11
ProcessorIntel 酷睿i3 四核3.6GHz
Graphics Card独立显卡1G
Memory8GB运行内存
Hard Disk500GHz
Display Resolution1920×1080

Applications

1. Semiconductor wafer testing 2. Automated factory testing 3. Data storage and analysis

Key Features

1. High-speed mapping and centralized control 2. SECS/GEM module for factory automation 3. Supports real-time data storage and interruption testing

Datasheet

Product Datasheet
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Supplier Information

<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>

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