F1 Silicon Probe Platform System
The world's first fully digital silicon probe platform system, designed with proprietary intellectual property rights, offering high precision and efficiency.
Specification Snapshot
Microscope Magnification Typical Value
225x
Chuck High Temperature Current 12-inch
≤231A
Chuck Maximum Voltage
10000V
Chuck Maximum Current
800A
Dimensions and Weight Typical Dimensions
~1500x1115x1543.5mm
Dimensions and Weight Maximum External Dimensions
~1750x1485x1613.5mm
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Overview
The world's first fully digital silicon probe platform system, designed with proprietary intellectual property rights, offering high precision and efficiency.
Specifications
| Parameter | Value |
|---|---|
| Travel X-axis | 301mm |
| Travel Y-axis | 301mm |
| Travel Z-axis | 2-10mm |
| Travel Theta axis | 10° |
| Positioning Accuracy X-axis | ≤0.05μm |
| Positioning Accuracy Y-axis | ≤0.05μm |
| Positioning Accuracy Z-axis | ≤1μm |
| Positioning Accuracy Theta axis | ±0.003° |
| Speed X-axis | ≥50mm/s |
| Speed Y-axis | ≥50mm/s |
| Speed Z-axis | ≥20mm/s |
| Maximum Speed X-axis | 150mm/s |
| Maximum Speed Y-axis | 150mm/s |
| Maximum Speed Z-axis | 35mm/s |
| Wafer Horizontal Positioning Capability | 100μm |
| Mapping Stability Average Time Minimum | <500ms |
| Mapping Stability Average Time Typical | <1s |
| Mapping Stability Average Time Maximum | <3s |
| XY Position Stability Minimum | 0.02μm |
| XY Position Stability Typical | 0.038μm |
| XY Position Stability Maximum | 1.5μm |
| Z Position Stability Minimum | 0.65μm |
| Z Position Stability Typical | 3.5μm |
| Z Position Stability Maximum | 15μm |
| Optical Shielding | ≥150dB |
| EM Shielding | ≥20dB 0.5-20GHz (typical) |
| Spectral Noise Level | ≤-150dBVrms/rtHz (≤1MHz) |
| System AC Noise | ≤15mVp-p (≤1GHz) |
| Vertical Anti-Vibration Frequency | 2.5-2.7Hz |
| Horizontal Anti-Vibration Frequency | 2.0-4.5Hz |
| Vertical Damping | 6%-20% |
| Horizontal Damping | 5%-6% |
| Air Supply Pressure | 0.3-0.5MPa |
| Maximum Load | 1600kg |
| Damping Efficiency | 5%-6% |
| Response Time to External Impact | <1s |
| Anti-Vibration Level | VC-C |
| Microscope Travel X-axis | 50mm |
| Microscope Travel Y-axis | 50mm |
| Microscope Travel Z-axis | 90mm |
| Microscope Maximum Positioning Accuracy X-axis | ±2μm |
| Microscope Maximum Positioning Accuracy Y-axis | ±2μm |
| Microscope Maximum Positioning Accuracy Z-axis | ±2μm |
| Microscope Speed X-axis | 60mm/s |
| Microscope Speed Y-axis | 60mm/s |
| Microscope Speed Z-axis | 120mm/s |
| Microscope Magnification Typical Value | 225x |
| Microscope Typical Optical Resolution | 3.0μm |
| Microscope High Resolution Optical Resolution | 1.5μm |
| Chuck Temperature Range 8-inch | -60°C to 300°C |
| Chuck Temperature Range 12-inch | -60°C to 300°C |
| Chuck Temperature Stability 8-inch | ±1°C |
| Chuck Temperature Stability 12-inch | ±1°C |
| Chuck Temperature Resolution 8-inch | 0.1°C |
| Chuck Temperature Resolution 12-inch | 0.1°C |
| Chuck High Temperature Current 8-inch | ≤132A |
| Chuck High Temperature Current 12-inch | ≤231A |
| Chuck High Temperature Voltage 8-inch | ≤30A |
| Chuck High Temperature Voltage 12-inch | ≤42A |
| Chuck Maximum Heating Power 8-inch | 5.5kW |
| Chuck Maximum Heating Power 12-inch | 12.5kW |
| Chuck Maximum Cooling Speed | 5m/s |
| Chuck Maximum Air Supply Pressure | 4bar |
| Chuck Maximum Voltage | 10000V |
| Chuck Maximum Current | 800A |
| Control Software Function AutoZ | Included |
| Control Software Function High AutoZ | Optional |
| Control Software Function Dual Interface | Microscope and Chuck Movement |
| High Precision Dual-Side Fiber Alignment System Active Axes | X,Y,Z,6X,6Y,6Z |
| High Precision Dual-Side Fiber Alignment System Travel Range | ±6.5,±16,±8.5mm |
| High Precision Dual-Side Fiber Alignment System Positioning Accuracy | 0.1μm |
| High Precision Dual-Side Fiber Alignment System Maximum Speed | 10mm/s |
| High Precision Dual-Side Fiber Alignment System Alignment Time | <5s |
| Six-Axis Controller Input Voltage Range | -5V to 5V |
| Six-Axis Controller ADC Resolution | 16bit |
| Six-Axis Controller Bandwidth | 5kHz |
| Six-Axis Controller Input Impedance | 15kohm |
| Six-Axis Controller Interface | BNC |
| Six-Axis Controller Processor | Intel Atom Dual Core (1.8GHz) |
| Six-Axis Controller User Software | futureC |
| Six-Axis Controller Operating Temperature Range | 5°C to 40°C |
| Six-Axis Controller Weight | 2.8kg |
| Six-Axis Positioner Active Axes | X,Y,Z,6X,6Y,6Z |
| Six-Axis Positioner Travel Range | ±17,±16,±6.5mm |
| Six-Axis Positioner Positioning Accuracy | 0.1μm |
| Six-Axis Positioner Maximum Speed | 10mm/s |
| Six-Axis Positioner Operating Temperature Range | 0°C to 50°C |
| Six-Axis Positioner Weight | 2.2kg |
| Nano Positioner Active Axes | X |
| Nano Positioner Active Axes | Y |
| Nano Positioner Active Axes | Z |
| Nano Positioner Open Loop Travel | 120μm/axis |
| Nano Positioner Closed Loop Travel | 100μm/axis |
| Nano Positioner Minimum Step | 2.5nm |
| Nano Positioner Linearity Error | 2% |
| Nano Positioner Alignment Time | <5s |
| Nano Positioner Operating Temperature Range | -20°C to 80°C |
| Nano Positioner Dimensions | 40x40x40mm |
| Nano Positioner Weight | 0.32kg |
| Nano Positioner Sensor Type | Optical Position Sensor |
| Nano Positioner Drive Type | PICMA® P-885.50 |
| Nano Positioner Capacitance | 1.5μF/axis |
| Nano Positioner Dynamic Operating Current Coefficient | 1.9μA/(Hz×μm) |
| Dimensions and Weight Typical Dimensions | ~1500x1115x1543.5mm |
| Dimensions and Weight Maximum External Dimensions | ~1750x1485x1613.5mm |
| Dimensions and Weight Main Unit Weight | ~850kg |
| Dimensions and Weight High-Low Temperature Controller Weight | ~180kg |
| Dimensions and Weight Robot Arm Weight | ~345kg |
Applications
1. Semiconductor testing 2. Optical calibration 3. Precision measurement
Key Features
1. Fully digital silicon probe platform system 2. Proprietary intellectual property rights 3. High precision and efficiency 4. Advanced AutoCal calibration software 5. High-speed and accurate positioning 6. Supports multiple testing and calibration applications
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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