F1 Silicon Probe Platform System

F1 Silicon Probe Platform System

Supplier
Eoulu
Part Number
F1 Silicon Probe Platform System
Category
Probe Station
Origin
China

The world's first fully digital silicon probe platform system, designed with proprietary intellectual property rights, offering high precision and efficiency.

Specification Snapshot
Microscope Magnification Typical Value
225x
Chuck High Temperature Current 12-inch
≤231A
Chuck Maximum Voltage
10000V
Chuck Maximum Current
800A
Dimensions and Weight Typical Dimensions
~1500x1115x1543.5mm
Dimensions and Weight Maximum External Dimensions
~1750x1485x1613.5mm
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Overview

The world's first fully digital silicon probe platform system, designed with proprietary intellectual property rights, offering high precision and efficiency.

Specifications

ParameterValue
Travel X-axis301mm
Travel Y-axis301mm
Travel Z-axis2-10mm
Travel Theta axis10°
Positioning Accuracy X-axis≤0.05μm
Positioning Accuracy Y-axis≤0.05μm
Positioning Accuracy Z-axis≤1μm
Positioning Accuracy Theta axis±0.003°
Speed X-axis≥50mm/s
Speed Y-axis≥50mm/s
Speed Z-axis≥20mm/s
Maximum Speed X-axis150mm/s
Maximum Speed Y-axis150mm/s
Maximum Speed Z-axis35mm/s
Wafer Horizontal Positioning Capability100μm
Mapping Stability Average Time Minimum<500ms
Mapping Stability Average Time Typical<1s
Mapping Stability Average Time Maximum<3s
XY Position Stability Minimum0.02μm
XY Position Stability Typical0.038μm
XY Position Stability Maximum1.5μm
Z Position Stability Minimum0.65μm
Z Position Stability Typical3.5μm
Z Position Stability Maximum15μm
Optical Shielding≥150dB
EM Shielding≥20dB 0.5-20GHz (typical)
Spectral Noise Level≤-150dBVrms/rtHz (≤1MHz)
System AC Noise≤15mVp-p (≤1GHz)
Vertical Anti-Vibration Frequency2.5-2.7Hz
Horizontal Anti-Vibration Frequency2.0-4.5Hz
Vertical Damping6%-20%
Horizontal Damping5%-6%
Air Supply Pressure0.3-0.5MPa
Maximum Load1600kg
Damping Efficiency5%-6%
Response Time to External Impact<1s
Anti-Vibration LevelVC-C
Microscope Travel X-axis50mm
Microscope Travel Y-axis50mm
Microscope Travel Z-axis90mm
Microscope Maximum Positioning Accuracy X-axis±2μm
Microscope Maximum Positioning Accuracy Y-axis±2μm
Microscope Maximum Positioning Accuracy Z-axis±2μm
Microscope Speed X-axis60mm/s
Microscope Speed Y-axis60mm/s
Microscope Speed Z-axis120mm/s
Microscope Magnification Typical Value225x
Microscope Typical Optical Resolution3.0μm
Microscope High Resolution Optical Resolution1.5μm
Chuck Temperature Range 8-inch-60°C to 300°C
Chuck Temperature Range 12-inch-60°C to 300°C
Chuck Temperature Stability 8-inch±1°C
Chuck Temperature Stability 12-inch±1°C
Chuck Temperature Resolution 8-inch0.1°C
Chuck Temperature Resolution 12-inch0.1°C
Chuck High Temperature Current 8-inch≤132A
Chuck High Temperature Current 12-inch≤231A
Chuck High Temperature Voltage 8-inch≤30A
Chuck High Temperature Voltage 12-inch≤42A
Chuck Maximum Heating Power 8-inch5.5kW
Chuck Maximum Heating Power 12-inch12.5kW
Chuck Maximum Cooling Speed5m/s
Chuck Maximum Air Supply Pressure4bar
Chuck Maximum Voltage10000V
Chuck Maximum Current800A
Control Software Function AutoZIncluded
Control Software Function High AutoZOptional
Control Software Function Dual InterfaceMicroscope and Chuck Movement
High Precision Dual-Side Fiber Alignment System Active AxesX,Y,Z,6X,6Y,6Z
High Precision Dual-Side Fiber Alignment System Travel Range±6.5,±16,±8.5mm
High Precision Dual-Side Fiber Alignment System Positioning Accuracy0.1μm
High Precision Dual-Side Fiber Alignment System Maximum Speed10mm/s
High Precision Dual-Side Fiber Alignment System Alignment Time<5s
Six-Axis Controller Input Voltage Range-5V to 5V
Six-Axis Controller ADC Resolution16bit
Six-Axis Controller Bandwidth5kHz
Six-Axis Controller Input Impedance15kohm
Six-Axis Controller InterfaceBNC
Six-Axis Controller ProcessorIntel Atom Dual Core (1.8GHz)
Six-Axis Controller User SoftwarefutureC
Six-Axis Controller Operating Temperature Range5°C to 40°C
Six-Axis Controller Weight2.8kg
Six-Axis Positioner Active AxesX,Y,Z,6X,6Y,6Z
Six-Axis Positioner Travel Range±17,±16,±6.5mm
Six-Axis Positioner Positioning Accuracy0.1μm
Six-Axis Positioner Maximum Speed10mm/s
Six-Axis Positioner Operating Temperature Range0°C to 50°C
Six-Axis Positioner Weight2.2kg
Nano Positioner Active AxesX
Nano Positioner Active AxesY
Nano Positioner Active AxesZ
Nano Positioner Open Loop Travel120μm/axis
Nano Positioner Closed Loop Travel100μm/axis
Nano Positioner Minimum Step2.5nm
Nano Positioner Linearity Error2%
Nano Positioner Alignment Time<5s
Nano Positioner Operating Temperature Range-20°C to 80°C
Nano Positioner Dimensions40x40x40mm
Nano Positioner Weight0.32kg
Nano Positioner Sensor TypeOptical Position Sensor
Nano Positioner Drive TypePICMA® P-885.50
Nano Positioner Capacitance1.5μF/axis
Nano Positioner Dynamic Operating Current Coefficient1.9μA/(Hz×μm)
Dimensions and Weight Typical Dimensions~1500x1115x1543.5mm
Dimensions and Weight Maximum External Dimensions~1750x1485x1613.5mm
Dimensions and Weight Main Unit Weight~850kg
Dimensions and Weight High-Low Temperature Controller Weight~180kg
Dimensions and Weight Robot Arm Weight~345kg

Applications

1. Semiconductor testing 2. Optical calibration 3. Precision measurement

Key Features

1. Fully digital silicon probe platform system 2. Proprietary intellectual property rights 3. High precision and efficiency 4. Advanced AutoCal calibration software 5. High-speed and accurate positioning 6. Supports multiple testing and calibration applications

Datasheet

Product Datasheet
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Supplier Information

<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>

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