F1 Probe Platform System
Eoulu F1 is the world's first fully digital probe platform system, offering high precision and advanced features for semiconductor testing and analysis.
Specification Snapshot
Magnification Range Large FOV
225x
Magnification Range High Resolution
500~2000x
Maximum External Pressure
10000V
Maximum External Current
800A
External Dimensions (W×D×H) Non-arm Machine
~1500×1115×1543.5mm
External Dimensions (W×D×H) Arm Machine
~2063×1620×1954mm
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Overview
Eoulu F1 is the world's first fully digital probe platform system, offering high precision and advanced features for semiconductor testing and analysis.
Specifications
| Parameter | Value |
|---|---|
| Travel X-axis | 301mm |
| Travel Y-axis | 301mm |
| Travel Z-axis | ≥10mm |
| Travel Theta axis | 10° |
| Positioning Accuracy X-axis | ≤0.05μm |
| Positioning Accuracy Y-axis | ≤0.05μm |
| Positioning Accuracy Z-axis | ≤1μm |
| Positioning Accuracy Theta axis | ±0.003° |
| Speed X-axis | 60mm/s |
| Speed Y-axis | 60mm/s |
| Speed Z-axis | 120mm/s |
| Maximum Speed X-axis | 150mm/s |
| Maximum Speed Y-axis | 150mm/s |
| Maximum Speed Z-axis | 35mm/s |
| Minimum Planar Optical Measurement Capability | 100μm |
| Mapping Signal Average Time Minimum Value | <500ms |
| Mapping Signal Average Time Typical Value | <1s |
| Mapping Signal Average Time Maximum Value | <3s |
| XY Position Stability Minimum Value | 0.02μm |
| XY Position Stability Typical Value | 0.038μm |
| XY Position Stability Maximum Value | 1.5μm |
| Z Position Stability Minimum Value | 0.65μm |
| Z Position Stability Typical Value | 3.5μm |
| Z Position Stability Maximum Value | 15μm |
| Optical Shielding | ≥150dB |
| EMI Shielding | ≥20dB@0.5~20GHz (typical) |
| Spectral Noise Level | ≤-150dBm/√Hz (≤1MHz) |
| System AC Noise | ≤15mVpp (≤1GHz) |
| Heavy Damping Characteristic Frequency Option 1 | 2.6~5.3Hz |
| Heavy Damping Characteristic Frequency Option 2 | 2.5~2.7Hz |
| Horizontal Direction Shock Absorption Option 1 | N/A |
| Horizontal Direction Shock Absorption Option 2 | 2.0~4.5Hz |
| Self-weight Damping Option 1 | N/A |
| Self-weight Damping Option 2 | 6%~20% |
| Horizontal Damping Option 1 | N/A |
| Horizontal Damping Option 2 | 5%~6% |
| Air Supply Voltage | 0.3~0.5MPa |
| Maximum Load Option 1 | 800kg |
| Maximum Load Option 2 | 1600kg |
| Isolation Efficiency Option 1 | ≥59% |
| Isolation Efficiency Option 2 | ≥59% |
| XY Axis Travel | 50mm |
| Z Axis Travel | 90mm |
| Maximum Travel Positioning Accuracy | ±3μm |
| Magnification Range Large FOV | 225x |
| Magnification Range High Resolution | 500~2000x |
| Typical Optical Resolution Capability Large FOV | 3.0μm |
| Typical Optical Resolution Capability High Resolution | 1.5μm |
| Temperature Range 8-inch Room Temperature | N/A |
| Temperature Range 8-inch High Temperature | -60~300°C |
| Temperature Range 12-inch Room Temperature | N/A |
| Temperature Range 12-inch High Temperature | -60~300°C |
| Minimum Temperature Rapid Reach Range 8-inch Room Temperature | N/A |
| Minimum Temperature Rapid Reach Range 8-inch High Temperature | -60~300°C |
| Minimum Temperature Rapid Reach Range 12-inch Room Temperature | N/A |
| Minimum Temperature Rapid Reach Range 12-inch High Temperature | -60~300°C |
| Temperature Accuracy | ±1°C |
| Temperature Resolution | 0.1°C |
| Normal Temperature Single Pressure Triax Chuck Leakage 8-inch Standard | <132μA |
| Normal Temperature Single Pressure Triax Chuck Leakage 8-inch Low Temperature | <65μA |
| Normal Temperature Single Pressure Triax Chuck Leakage 12-inch Standard | <231μA |
| Normal Temperature Single Pressure Triax Chuck Leakage 12-inch Low Temperature | <65μA |
| Normal Temperature Single Pressure Triax Chuck Single End 8-inch Standard | <30μA |
| Normal Temperature Single Pressure Triax Chuck Single End 8-inch Low Temperature | <16μA |
| Normal Temperature Single Pressure Triax Chuck Single End 12-inch Standard | <42μA |
| Normal Temperature Single Pressure Triax Chuck Single End 12-inch Low Temperature | <16μA |
| Maximum External Pressure | 10000V |
| Maximum External Current | 800A |
| 8-inch Stage Cooling and Heating Time Air Cooling Option 1 | -60°C→25°C:7min,25°C→300°C:33min,300°C→25°C:15min,25°C→-60°C:25min |
| 8-inch Stage Cooling and Heating Time Air Cooling Option 2 | -60°C→25°C:22min,25°C→300°C:25min,300°C→25°C:25min,25°C→-60°C:30min |
| 8-inch Stage Cooling and Heating Time Water Cooling Option | -60°C→25°C:23min,25°C→300°C:28min,300°C→25°C:25min,25°C→-60°C:37min |
| 12-inch Stage Cooling and Heating Time Air Cooling Option 1 | -60°C→25°C:7min,25°C→300°C:33min,300°C→25°C:15min,25°C→-60°C:25min |
| 12-inch Stage Cooling and Heating Time Air Cooling Option 2 | -60°C→25°C:22min,25°C→300°C:25min,300°C→25°C:25min,25°C→-60°C:30min |
| 12-inch Stage Cooling and Heating Time Water Cooling Option | -60°C→25°C:23min,25°C→300°C:28min,300°C→25°C:25min,25°C→-60°C:37min |
| Noise Air Cooling Option 1 | ≤65dB |
| Noise Air Cooling Option 2 | ≤70dB |
| Noise Water Cooling Option | ≤72dB |
| Weight Air Cooling Option 1 | ≤180kg |
| Weight Air Cooling Option 2 | ≤295kg |
| Weight Water Cooling Option | ≤180kg |
| External Dimensions (W×D×H) Non-arm Machine | ~1500×1115×1543.5mm |
| External Dimensions (W×D×H) Arm Machine | ~2063×1620×1954mm |
| Maximum External Dimensions (W×D×H) Non-arm Machine | ~1750×1465×1613.5mm |
| Maximum External Dimensions (W×D×H) Arm Machine | ~2373×1620×2004mm |
| Weight Non-arm Machine | 540~850kg |
| Weight Arm Machine | 280~345kg |
Applications
1. Semiconductor testing 2. Wafer inspection 3. High-precision measurement 4. Research and development
Key Features
1. Fully digital platform 2. High precision positioning 3. Advanced optical shielding 4. Comprehensive EMI shielding 5. Flexible and modular design
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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