Cryogenic Probe Station
A high-precision cryogenic probe station designed for advanced scientific research and testing applications.
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Overview
A high-precision cryogenic probe station designed for advanced scientific research and testing applications.
Specifications
| Parameter | Value |
|---|---|
| Temperature Range 4K闭循环制冷机样品台温度 | <4K-350K |
| Temperature Range 10K闭循环制冷机样品台温度 | <10K-350K |
| Temperature Stability | ±0.1K |
| Vacuum Chamber Material | Aluminum |
| Vacuum Chamber Probe Count | 6 |
| Vacuum Chamber Cover | Movable cover with window |
| Vacuum Chamber Window Material | Quartz |
| Vacuum Chamber Optical Diameter | 63mm |
| Radiation Shield Material | Oxygen-free copper |
| Radiation Shield Probe Count | 6 |
| Radiation Shield Cover | Movable low-temperature window with sapphire |
| Radiation Shield Window Material | Sapphire |
| Radiation Shield Optical Diameter | 35mm |
| Grounded Sample Stage Diameter | 35mm |
| Insulated Sample Stage Diameter | 35mm |
| Coaxial Sample Stage Diameter | 35mm |
| Tri-coaxial Sample Stage Diameter | 35mm |
| Magnet | Electromagnet for probe station |
| Magnetic Field Direction | Horizontal |
| Magnetic Induction Intensity | >10000Gs |
| Pole Face Diameter | 50mm |
| Pole Face Distance | 2L/min, 2-3kg/cm² |
| Power Supply | Dual-polarity power supply, 10A, 100V |
| Probe Positioning Stage Drive | Manual (optional electric) |
| Probe Positioning Stage X-axis Movement Range | 50mm |
| Probe Positioning Stage Y-axis Movement Range | 25mm |
| Probe Positioning Stage Z-axis Movement Range | 15mm |
| Probe Positioning Stage Minimum Scale | 10μm |
| Probe Positioning Stage Sensitivity | 5μm |
| Sample Stage Vibration | <1μm |
| Damping System | 3 levels |
| Vacuum Pumping Time (4L Mechanical Pump) | ~30min |
| Vacuum Pumping Time (600 Molecular Pump) | ~8min |
| Cooling Time | ~120-150min |
| Temperature Sensor | Silicon diode and Cernox |
| Heater | 50W single-head heater |
| GSG Microwave Probe 40GHz Connector Type | K-type |
| GSG Microwave Probe 40GHz Frequency | 0-40GHz |
| GSG Microwave Probe 40GHz Tip Material | Tungsten |
| GSG Microwave Probe 40GHz Tip Material | beryllium copper |
| GSG Microwave Probe 40GHz Tip Distance | 50-250μm |
| GSG Microwave Probe 50GHz Connector Type | 2.4-type |
| GSG Microwave Probe 50GHz Frequency | 0-50GHz |
| GSG Microwave Probe 50GHz Tip Material | Tungsten |
| GSG Microwave Probe 50GHz Tip Material | beryllium copper |
| GSG Microwave Probe 50GHz Tip Distance | 50-250μm |
| GSG Microwave Probe 67GHz Connector Type | 1.85-type |
| GSG Microwave Probe 67GHz Frequency | 0-67GHz |
| GSG Microwave Probe 67GHz Tip Material | Tungsten |
| GSG Microwave Probe 67GHz Tip Material | beryllium copper |
| GSG Microwave Probe 67GHz Tip Distance | 50-1250μm |
| Optical Interface Wavelength Range | UV-visible or visible light-infrared |
| Optical Interface Connector | SMA |
| Optical Interface Fiber Specification | 100-400μm |
| Optical Interface Type | Single-core or multi-core |
| Optical Interface Fiber Material | Polyimide cladding |
| Optical Interface Fiber Material | quartz core |
| DC Low-Frequency Probe Coaxial Cable | Standard |
| DC Low-Frequency Probe Connector | SMA or BNC |
| DC Low-Frequency Probe Frequency | 0-100MHz |
| DC Low-Frequency Probe Impedance | 50Ohm |
| DC Low-Frequency Probe Tri-coaxial Cable | Optional |
| Electron Microscope Zoom | 16:1 |
| Electron Microscope Sensor | 1/2” CMOS |
| Electron Microscope Field of View | 12.8mm-0.8mm |
| Electron Microscope Working Distance | 89mm |
| Electron Microscope Light | Ring or coaxial |
| Electron Microscope Resolution | 2μm |
| Electron Microscope Stand | Suspension |
| Electron Microscope Display | 24” LCD |
Applications
1. Semiconductor testing 2. Material analysis 3. Cryogenic experiments
Key Features
1. High precision 2. Wide temperature range 3. Advanced vibration damping system
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Yingbo Scientific Instruments (Shanghai) Co., Ltd. is an enterprise focused on providing comprehensive solutions for semiconductor wafer-level testing systems, micro-nano science and other fields. It mainly provides advanced semiconductor testing systems and micro-nano scientific instruments and equipment to universities, scientific research institutes and enterprises and institutions, and is committed to bringing scientific research products with market prospects to the market.</p><p><br></p><p><br></p><p> At present, the company has become one of the few domestic companies that provides professional scientific instruments such as semiconductor wafer-level testing systems and micro-nano processing. In the fields of semiconductor wafer-level testing system solutions, micro-nano processing equipment, micro-nano characterization equipment, micro-nano field consumables, micro-nano processing and testing, micro-nano peripheral products and other related fields, the company has an experienced and highly skilled team that can excellently complete all-round services before, during and after sales. The company is headquartered in Shanghai, and has offices in Beijing and Shenzhen. It has established 8 after-sales service outlets in Wuhan, Xi'an, Chengdu, Hefei, Shenyang, Nanjing, Xiamen, Xuzhou and other places. The outlets across the country provide customers with a large number of high-quality equipment and after-sales services, and have won a good reputation and reputation in the semiconductor technology service industry.</p><p><br></p><p> The company adheres to the value concepts of innovation, integrity, professionalism and efficiency, and provides high-quality equipment and technical services to partners. In the future, the company will continue to recommend the introduction of innovative and efficient product instruments and contribute a small amount to the development of the motherland's semiconductor science industry!</p>
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