OPAL-SD

OPAL-SD

Supplier
Exfo
Part Number
OPAL-SD
Category
Probe Station
Origin
Canada

The OPAL-SD is a semi-automated test station designed for high-performance characterization of photonic integrated circuits (PICs). It offers flexibility, precision, and scalability for testing single-die PICs in research and development environments.

Specification Snapshot
Magnification
10
Maximum Frame Rate (fps)
144
Depth of Field (μm)
3.6
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Overview

The OPAL-SD is a semi-automated test station designed for high-performance characterization of photonic integrated circuits (PICs). It offers flexibility, precision, and scalability for testing single-die PICs in research and development environments.

Specifications

ParameterValue
Mechanical Positioning6D manual coarse adjustment with articulated arm, XY manual translation stage
MountingCompatible with metric and imperial optical breadboard, at 90° and 45°
X,Y Axis Travel Range (mm)48
X,Y Axis Displacement/Revolution (mm)0.3175
Lens TypeTelecentric
Magnification10
Numerical aperture0.28
Field of View (mm)2.9×2.2
Working Distance (mm)34
Wavelength RangeVisible
Resolution (MP)2.9
Maximum Frame Rate (fps)144
Sensor Format (inch)2/3
Sensor TypeColor, global shutter, 12 bit
WavelengthVisible
Size (H×W×D)1438mm×914mm×945mm
Weight (kg)160
Operating EnvironmentClean environment to avoid temperature variations
Operating Environmentvibrations
Operating Environmenthumidity
Operating Environmentand dust
BaseBase frame with passive vibration isolation
Basecanisters
Baseand feet
Maximum Number of Electrical or Optical HeadsUp to 4
Optical BreadboardGrid of M6 threaded mounting holes, 25mm hole spacing, black anodized for reduced reflections
Monitor27in
Cables, Power Supply, Drive ControllersAll included
Additional Communication PortsEthernet Cat 6 RJ54, USB 3.0
X Axis Travel (mm)20
Z Axis Travel (mm)11
Rz Axis Travel (°)38
Z Axis Displacement/Revolution (mm)0.085
Rz Axis Displacement/Revolution (°)1.2
Work Area (mm²)50×50
RangeAmbient or Dew-point (0°C to 120°C)
Resolution0.01°C
Stability0.05°C
Heating Rate40°C/min
Cooling Rate-15°C/min
Vacuum Zones3 zones
Electrical SurfaceFloating (F)
X Axis Resolution (nm)1
Y Axis Resolution (nm)1
Z Axis Resolution (nm)1
X Axis Repeatability (nm)50
Y Axis Repeatability (nm)50
Z Axis Repeatability (nm)50
Rx Axis Travel (°)38
Rx Axis Resolution (arcsec)0.04
Rz Axis Resolution (arcsec)0.04
Rx Axis Repeatability (arcsec)1.1
Rz Axis Repeatability (arcsec)1.1
Full Virtual Pivot PointYes
Injection Angle (°)8
Fiber Array Width (mm)<4.5
Mechanical ReleaseNo
Depth of Field (μm)3.6
Horizontal Field of View (mm)0.88
Illumination TypeIn-line through video microscope unit, LED illuminator

Applications

1. Optical and electrical probing and testing of PIC at the die, module, or bar-level 2. For R&D, low-volume design verification and test development 3. Perfect for academia and R&D teams 4. Platform-agnostic: silicon photonics, indium phosphide, III-V, polymer, heterogeneous 5. Application-agnostic: telecom & datacom transceivers, quantum, LIDAR, sensors, AI

Key Features

1. Accurate and flexible testing for photonic integrated circuits 2. Scalable and upgradeable design for research and development 3. High-resolution vision systems for precise optical alignment and probing 4. Integrated EXFO Pilot software for automation and data management

Datasheet

Product Datasheet
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Supplier Information

<p>EXFO develops smarter test, monitoring and analytics solutions for the global communications industry. As a trusted advisor, we serve fixed and mobile network operators, hyperscale data centers, and leaders in production and R&D. We provide insights into superior network performance, service reliability, and user experience. Backed by 40 years of innovation, EXFO uniquely combines equipment, software and services to enable customers to upgrade 5G, cloud-native and fiber networks faster and more reliably.</p>

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OPAL-SD
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