Calcium Fluoride CaF2 CAF-A
DESIOPTOE is a professional manufacturer of fluoride crystals. With our superior crystal growth technology, DESIOPTOE has improved the durability of CaF₂ crystal under long-term exposure to high-power UV lasers, making it an excellent choice for semiconductor lithography, semiconductor inspection, excimer lasers, DUV solid lasers, deep space exploration, microscopy, and other DUV applications. Due to the excellent transmittance performance of CaF₂ crystal in the DUV-VIS-IR spectrum, as well as its physical stability, chemical inertness and good processability, CaF₂ crystal can be widely used in various optical applications, such as astronomy, photography, HDTV zoom lenses, microscopes, infrared systems, spectrometers, and medical lasers, etc. DESIOPTOE provides CaF₂ crystal blanks and optical components in various specifications within 600mm, offering products with standard crystal orientations and supporting customized crystal orientations.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Crystal Structure | Cubic, Fluorite Type |
| Cleavage Plane | (111) |
| Lattice Constant | a=0.546 |
| Molecular Mass | 78.08g/mol |
| Density | 3.18g/cm³ |
| Melting Point | 1420°C |
| Solubility [H₂O at 20°C] | 1.6g/L H₂O at 20°C |
| Specific Heat Capacity | 0.893J/(g·K) |
| Thermal Conductivity | 9.70W/(m·K) |
| Thermal Diffusivity | 35.6×10⁻⁷m²/sec |
| Linear Thermal Expansion Coefficient [20~300°C] | 20.8×10⁻⁶/K |
| Linear Thermal Expansion Coefficient [-30~70°C] | 18.41×10⁻⁶/K |
| Linear Thermal Expansion Coefficient [0~25°C] | 18.5×10⁻⁶/K |
| Dielectric Constant [at 27°C] | 6.81 at 27°C |
| Weathering Resistance Class CR | 1 |
| Acid Resistance Class SR | 4.5 |
| Alkali Resistance Class AR | 2.3 |
| Phosphate Resistance Class PR | 1.3 |
| Bulk Modulus | 83.8 GPa |
| Shear Modulus | 34.6 GPa |
| Young's Modulus [<100>] | 146 GPa |
| Young's Modulus [<110>] | 101 GPa |
| Young's Modulus [<111>] | 91 GPa |
| Poisson's Ratio μ | 0.343 |
| Knoop Hardness | 82 |
| Mohs Hardness | 4 |
| Scratch/Dig Limit | 10-5 |
| Micro-roughness Limit | ≤0.2nm |
| Wavefront errors Limit | λ/10 |
| Crystal Orientations | Custom crystal orientations are available upon request |
| Surface Finishing | TSK/ Wire Cutting, Fine Grinding, Precision Polishing, Coating |
| Optical Components | Windows, Wedges, Prisms, Various Types of Lenses, etc. |
| Refractive index n₂₃₂₅ [λ_vac=2325.59nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.42212 |
| Refractive index n₁₉₇₀ [λ_vac=1970.56nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.42401 |
| Refractive index n₁₅₃₀ [λ_vac=1530nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.42612 |
| Refractive index n₁₀₆₀ [λ_vac=1060nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.42851 |
| Refractive index n_t [λ_vac=1014.25nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.42879 |
| △n/△T(N₂) [λ_vac=1014.25nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.6 10⁻⁶/K |
| Refractive index n_s [λ_vac=852.35nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43002 |
| △n/△T(N₂) [λ_vac=852.35nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.7 10⁻⁶/K |
| Refractive index n_r [λ_vac=706.71nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43166 |
| △n/△T(N₂) [λ_vac=706.71nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.7 10⁻⁶/K |
| Refractive index n_c [λ_vac=656.45nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43245 |
| △n/△T(N₂) [λ_vac=656.45nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_c′ [λ_vac=644.03nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43267 |
| △n/△T(N₂) [λ_vac=644.03nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_He-Ne [λ_vac=632.98nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43288 |
| △n/△T(N₂) [λ_vac=632.98nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_D [λ_vac=589.46nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.4338 |
| △n/△T(N₂) [λ_vac=589.46nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_d [λ_vac=587.73nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43384 |
| △n/△T(N₂) [λ_vac=587.73nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_e [λ_vac=546.23nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43493 |
| △n/△T(N₂) [λ_vac=546.23nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_F [λ_vac=486.27nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43701 |
| △n/△T(N₂) [λ_vac=486.27nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_F′ [λ_vac=480.13nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43726 |
| △n/△T(N₂) [λ_vac=480.13nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.8 10⁻⁶/K |
| Refractive index n_g [λ_vac=435.96nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.43948 |
| △n/△T(N₂) [λ_vac=435.96nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.7 10⁻⁶/K |
| Refractive index n_h [λ_vac=404.77nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.44149 |
| △n/△T(N₂) [λ_vac=404.77nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.6 10⁻⁶/K |
| Refractive index n_i [λ_vac=365.12nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.44488 |
| △n/△T(N₂) [λ_vac=365.12nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.4 10⁻⁶/K |
| Refractive index n₃₃₄ [λ_vac=334.24nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.44848 |
| △n/△T(N₂) [λ_vac=334.24nm; Measured at 22°C, Nitrogen gas 1013hPa] | -9.1 10⁻⁶/K |
| Refractive index n₃₁₂ [λ_vac=312.66nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.45173 |
| △n/△T(N₂) [λ_vac=312.66nm; Measured at 22°C, Nitrogen gas 1013hPa] | -8.8 10⁻⁶/K |
| Refractive index n₂₉₆ [λ_vac=296.82nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.45463 |
| △n/△T(N₂) [λ_vac=296.82nm; Measured at 22°C, Nitrogen gas 1013hPa] | -8.5 10⁻⁶/K |
| Refractive index n₂₈₀ [λ_vac=280.43nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.45824 |
| △n/△T(N₂) [λ_vac=280.43nm; Measured at 22°C, Nitrogen gas 1013hPa] | -8.1 10⁻⁶/K |
| Refractive index n₂₄₈ [λ_vac=248.35nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.46791 |
| △n/△T(N₂) [λ_vac=248.35nm; Measured at 22°C, Nitrogen gas 1013hPa] | -6.9 10⁻⁶/K |
| Refractive index n₁₉₄ [λ_vac=194.23nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.5006 |
| △n/△T(N₂) [λ_vac=194.23nm; Measured at 22°C, Nitrogen gas 1013hPa] | -3.2 10⁻⁶/K |
| Refractive index n₁₉₃ [λ_vac=193.37nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.50143 |
| △n/△T(N₂) [λ_vac=193.37nm; Measured at 22°C, Nitrogen gas 1013hPa] | -3.2 10⁻⁶/K |
| Refractive index n₁₈₄ [λ_vac=184.95nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.51055 |
| △n/△T(N₂) [λ_vac=184.95nm; Measured at 22°C, Nitrogen gas 1013hPa] | -2.5 10⁻⁶/K |
| Refractive index n₁₅₇** [λ_vac=157.63nm; Measured at 22°C, Nitrogen gas 1013hPa] | 1.55927 |
| Relative Partial Dispersion P_s,t | 0.2698 |
| Relative Partial Dispersion P_c,s | 0.5333 |
| Relative Partial Dispersion P_d,c | 0.3046 |
| Relative Partial Dispersion P_e,d | 0.2388 |
| Relative Partial Dispersion P_g,F | 0.5389 |
| Relative Partial Dispersion P_i,h | 0.7462 |
| Deviation of Relative Partial Dispersion △P_C,t | -0.194 |
| Deviation of Relative Partial Dispersion △P_C,s | -0.092 |
| Deviation of Relative Partial Dispersion △P_F,e | 0.0183 |
| Deviation of Relative Partial Dispersion △P_g,F | 0.0552 |
| Deviation of Relative Partial Dispersion △P_i,g | 0.2636 |
| Laser-Induced Damage Threshold [6.7ns; @193nm] | ~6.22J/cm²（6.7ns @193nm） |
| Laser-Induced Damage Threshold [10ns; @193nm] | ~7.5J/cm²（10ns @193nm） |
| Stress Birefringence | 0-10nm/cm on request |
| Recommended Wavelength | ArF excimer laser (193nm) |
| Internal Transmittance [@193nm] | >99.8%@193nm |
| Laser Durability | LD-1 |
Applications
Key Features
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