WDM Device Scanning System
WDM multi-channel multiplexing/demultiplexing testing Supports Mueller polarization dependent loss testing Full-band with PDL testing in less than 10 seconds Supports one-stop return loss, directivity and polarization insertion loss testing Supports one tunable light source for parallel testing at 16 stations simultaneously
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Overview
Specifications
| Parameter | Value |
|---|---|
| Maximum Supported Station Count | 16 |
| Number of Supported Power Meter Channels per Station | 2/4/8/16/48/64 |
| Wavelength Resolution | 1 |
| Wavelength Accuracy | 5nm |
| Light Source Scan Repeatability | 0.02dB |
| Polarization Dependent Loss Repeatability | 0.03 |
| Insertion Loss Measurement Range | +10～-70dBm |
| Measurement Uncertainty | 5% |
| Sweep Time | <12 sec @100nm bandwidth with PDL test; <6 sec @100nm bandwidth without PDL test |
| Operating Power Supply | 110VAC/220VAC 50HZ |
| Others | Supports 2/4/8/16/48/64 multi-channel CWDM/LANWDM/DWDM, database data storage, XML test reports, and shipment report printing. |
Datasheet
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Supplier Information
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