M1 Probe Platform System
The M1 Probe Platform System is a cutting-edge automated probe platform designed for precise and efficient testing of semiconductor chips. It integrates advanced shielding, vibration isolation, and temperature control technologies to ensure high accuracy and reliability.
Specification Snapshot
Microscope-Front-Magnification Range
500-2000x
Microscope-Front-Typical Optical Image Resolution
Physical 11μm, calculation algorithm achieves 5.5μm
Microscope-Rear-Magnification Range
200x
Resolution-R Axis
10μm or less
Typical Dimensions (W×D×H)
~1650×1600×1560mm
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Overview
The M1 Probe Platform System is a cutting-edge automated probe platform designed for precise and efficient testing of semiconductor chips. It integrates advanced shielding, vibration isolation, and temperature control technologies to ensure high accuracy and reliability.
Specifications
| Parameter | Value |
|---|---|
| Travel Range X-axis | 301mm |
| Travel Range Y-axis | 501mm |
| Travel Range Z-axis | 20mm |
| Travel Range Theta-axis | 10° |
| Positioning Accuracy X-axis | ≤1μm |
| Positioning Accuracy Y-axis | ≤0.05μm |
| Positioning Accuracy Z-axis | ≤1μm |
| Positioning Accuracy Theta-axis | ±0.003° |
| Speed X-axis | ≥50mm/s |
| Speed Y-axis | ≥50mm/s |
| Speed Z-axis | ≥20mm/s |
| Maximum Speed X-axis | 150mm/s |
| Maximum Speed Y-axis | 150mm/s |
| Maximum Speed Z-axis | 35mm/s |
| Shielding Capability-Light Shielding | ≥150dB |
| Shielding Capability-EMI Shielding | ≥20dB 0.5-20GHz |
| Shielding Capability-Spectral Noise Level | ≤-150dBVrms/√Hz (≤1MHz) |
| Shielding Capability-System AC Noise | ≤15mVp-p (≤1GHz) |
| Vibration Isolation-Vertical Natural Frequency | 2.5-2.7Hz |
| Vibration Isolation-Horizontal Natural Frequency | 2.0-4.5Hz |
| Vibration Isolation-Vertical Damping Ratio | 6%-20% |
| Vibration Isolation-Horizontal Damping Ratio | 5%-6% |
| Vibration Isolation-Air Supply Pressure | 0.3-0.5Mpa |
| Vibration Isolation-Maximum Load | 1600kg |
| Vibration Isolation-Isolation Efficiency | 5%-6% |
| Vibration Isolation-Response Time to External Impact | <1s |
| Microscope-Front-CCD or CMOS Quantity | 3 |
| Microscope-Front-Travel Range | 12.5mm |
| Microscope-Front-Movement Resolution | <2μm |
| Microscope-Front-Maximum Speed | 5mm/s |
| Microscope-Front-Magnification Range | 500-2000x |
| Microscope-Front-Typical Optical Image Resolution | Physical 11μm, calculation algorithm achieves 5.5μm |
| Microscope-Front-Virtual Calculation | 10 EOULU proprietary algorithms |
| Microscope-Rear-CCD or CMOS Quantity | 1 |
| Microscope-Rear-Travel Range | Same as object field of view |
| Microscope-Rear-Movement Resolution | <2μm |
| Microscope-Rear-Maximum Speed | 5mm/s |
| Microscope-Rear-Magnification Range | 200x |
| Microscope-Rear-Typical Optical Image Resolution | 4.5μm |
| Microscope-Rear-Virtual Calculation | 3 EOULU proprietary algorithms |
| Chuck-Temperature Range | Room temperature, -60°C to 300°C |
| Chuck-Temperature Stability | ±1°C |
| Chuck-Temperature Resolution | 0.1°C |
| Chuck-Normal Temperature Leakage Current Triax Chuck | ≤231fA |
| Chuck-Normal Temperature Noise Triax Chuck | ≤42fA |
| Robot Arm Travel Range-R Axis | 630mm |
| Robot Arm Travel Range-Theta Axis | 340° |
| Robot Arm Travel Range-Z Axis | 300mm |
| Translation Speed-R Axis | 430mm/s |
| Translation Speed-Theta Axis | 240mm/s |
| Translation Speed-Z Axis | 180mm/s |
| Maximum Speed-R Axis | 640mm/s |
| Maximum Speed-Theta Axis | 340mm/s |
| Maximum Speed-Z Axis | 250mm/s |
| Resolution-R Axis | 10μm or less |
| Resolution-Theta Axis | 0.0015° |
| Resolution-Z Axis | 2μm |
| Robot Arm Weight Repeatability | ±0.1mm or less |
| Calibration Accuracy | Within ±0.1mm from center, ±0.1° from edge |
| Calibration Time | ≤3s |
| First Load | 79s |
| UnLoad | 58s |
| Next Load | 46s |
| Typical Dimensions (W×D×H) | ~1650×1600×1560mm |
| Main Unit Weight | ~750kg |
| High-Low Temperature Controller (Liquid Cooling) Weight | ~245kg |
| High-Low Temperature Controller (Air Cooling) Weight | ~295kg |
| Installation Environment Requirements-Installation Temperature | 17°C to 25°C, ±0.5°C |
| Installation Environment Requirements-Installation Humidity | 20%-60% |
| Installation Environment Requirements-Storage Temperature | 10°C to 30°C |
| Installation Environment Requirements-Storage Humidity | ≤50% |
| Installation Environment Requirements-On-site Requirements-Horizontal | ≤100micrometers/sec rms |
| Installation Environment Requirements-On-site Requirements-Vertical | ≤200kgf |
| Power Requirements-Probe Platform | Single-phase 220VAC (Voltage fluctuation ±7%-10%), 50/60Hz, 1800VA, current 10A max |
| Power Requirements-High-Low Temperature Control System | Three-phase 380VAC (Voltage fluctuation ±7%-10%), 50/60Hz, current 32A max |
| Compressed Dry Air-Normal Temperature Probe Platform | Air pressure: 4.5-8bar (65-116psi), minimum temperature: -20°C |
| Compressed Dry Air-High-Low Temperature Probe Platform | Air pressure: 4.5-8bar (65-116psi), minimum temperature: -70°C |
| Accessory Temperature Controller-Temperature Range | -60°C to 300°C |
Applications
1. Semiconductor chip testing 2. Precision measurement in electronics 3. Research and development in microelectronics
Key Features
1. Advanced shielding technology for precise measurements 2. Vibration isolation for stable operation 3. High temperature control accuracy 4. Automated calibration and loading system 5. Compact design for space efficiency
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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