EML Aging Test System
The EML Aging Test System is designed for precise aging testing of EML devices, ensuring reliable performance and stability under various conditions.
Specification Snapshot
Device Dimensions (W×H×D)
PSS EMLB11536: 800×1900×890(mm); PSS EMLB21536: 1400×1800×1200(mm)
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Overview
The EML Aging Test System is designed for precise aging testing of EML devices, ensuring reliable performance and stability under various conditions.
Specifications
| Parameter | Value |
|---|---|
| Aging Scale | 1536 |
| LD Drive Current | 0~250mA, ±1%FS±1mA |
| SOA Drive Current | 0~250mA, ±1%FS±1mA |
| PD Reverse Voltage | 0~5V, ±1%FS±0.2V |
| LD Forward Voltage | 0~5V, ±1%FS±20mV |
| LD Monitor Current | 0~250mA, ±1%FS±1mA |
| SOA Monitor Current | 0~250mA, ±1%FS±1mA |
| PD Monitor Current | 0~2000μA, ±1%FS±5μA |
| EA Voltage | 0~5V, ±1%FS±20mV |
| EA Current | 0~250mA, ±1%FS±2mA |
| LIV Scanning | Supports threshold calculation |
| Temperature Control Method | PSS EMLB11536: Internal TEC control; PSS EMLB21536: External environment control |
| TEC Current Range | -1A~1A |
| Temperature Control Range | PSS EMLB11536: RT~130°C; PSS EMLB21536: RT+20°C~150°C |
| Temperature Stability | ±0.5°C |
| Database | Built-in SQL database for saving LD test data |
| Working Requirements | 25°C±5°C, Humidity≤50% |
| Storage Requirements | 0°C~40°C, Humidity≤50% |
| Device Dimensions (W×H×D) | PSS EMLB11536: 800×1900×890(mm); PSS EMLB21536: 1400×1800×1200(mm) |
| Power Specifications | PSS EMLB11536: AC220V/50HZ; PSS EMLB21536: AC380V/50HZ |
| Power | 220V 7000W |
| Warranty Period | 1 year |
Applications
1. EML device aging testing 2. Semiconductor laser reliability testing 3. Optical communication component evaluation
Key Features
1. High precision aging test for EML devices 2. Supports internal and external temperature control 3. Built-in SQL database for data storage 4. Wide temperature control range 5. High temperature stability
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Wuhan Precise Electronics Technology Co., Ltd. is a high-tech enterprise in Wuhan·China Optical Valley, awarded as a specialized and new 'Little Giant' enterprise. It focuses on testing instruments and system solutions in the laser and semiconductor fields, covering optical communication, lidar, laser display, laser medical, and wafer chip device production lines. It has independently developed instruments and systems such as laser comprehensive test systems, photodetector comprehensive test systems, reliability analysis equipment, precision source meters, high-current precision chip testers, and high-current narrow-pulse wafer testers, achieving domestic substitution. The company has a high market share in multiple product categories and is a professional testing system solution provider in China.</p>
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