Cadmium Zinc Telluride CZT
Cadmium zinc telluride single crystal (Cd1-xZnxTe, CZT) is a wide-bandgap II–VI compound semiconductor considered a CdTe/ZnTe solid solution. At room temperature and pressure it has a cubic zinc-blende structure. Melting point varies from 1092 to 1295°C with Zn content. Adjusting the Zn fraction tunes the lattice constant for exact matching to narrow-bandgap HgCdTe, making CZT a preferred epitaxial substrate widely used for high-performance infrared focal-plane detectors.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Chemical Composition [Explicit Subscripts in Source Table Heading] | Cd₀.₉₆Zn₀.₀₄Te |
| Thickness Dimension Tolerance | Thickness Tolerance ±50μm, Dimension Tolerance ±100μm |
| Crystal Orientation | (111) Crystal Orientation Deviation Not Greater Than 0.2° |
| Surface Quality [Source Literal 境检 Retained] | 境检: No Scratches, No Point Defects in Array Area, No Edge Chips |
| Internal Defects [Source Table Wording Retained Literally] | Substrate Morphology, Uniform Substrate (Source: 衬底貌相衬底均匀) |
| Deposited Phase | <10 μm |
| Dislocation Density | <1×10⁵/cm² |
| Flatness | ≤5 μm |
| Roughness | ≤1 nm |
| Transmittance | >55 % |
| Peak Half-Width [Source Double-Quote Angular Symbol Retained without Guessing Arcsecond Wording] | ≤40″ |
| Composition | 0.036~0.06 |
| Dimensions | Customizable to Requirements |
Applications
Datasheet
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