LTHS3 Nanopositioning Stage

LTHS3 Nanopositioning Stage

Supplier
Nano-stage
Part Number
LTHS3
Category
Positioner
Origin
China

The LTHS3 is a three-axis (X,Y,Z) stage with up to 75µm travel in X and Y and 50µm in Z. Its very low profile of 22.3mm makes it easy to integrate into inverted microscopes, usually with a coarse-positioning microscope stage; see our hybrid systems. This nanopositioner is part of our high-speed product line, with a high-power controller available.

Specification Snapshot
Cable length
2 m
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Overview

The LTHS3 is a three-axis (X,Y,Z) stage with up to 75µm travel in X and Y and 50µm in Z. Its very low profile of 22.3mm makes it easy to integrate into inverted microscopes, usually with a coarse-positioning microscope stage; see our hybrid systems. This nanopositioner is part of our high-speed product line, with a high-power controller available.

Specifications

ParameterValue
Range of motion XY/Z75/50
Resolution XY/Z0.075/0.05
Noise floor XY/Ztypical:0.0075/0.005
Repeatability XY/Z0.15/0.1
Linearizationtypical:0.02%
Resonant frequency XYZ1500/1000/1500
Stiffness X/YZ4/3
SensorSilicon HR Sensor
Size W x L x H190 mm × 152.5 mm × 22.3 mm
MaterialAluminium
Cable length2 m
ControllerStandard
Maximum load* [Horizontal use]0.2 kg
Maximum load* [Vertical use]0.1 kg

Datasheet

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Supplier Information

Na
Nano-stage
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Beijing Naz Precision Technology Co., Ltd. was established in 2018, located in Haidian District, Beijing. The company is dedicated to precision positioning equipment, providing piezoelectric ceramic nano positioning stages, large stroke nano positioning stages, air bearing rotary tables, multi-axis stages, laser interferometers, etc., widely applied in metrology, microscopy, life sciences, laser technology, and semiconductor fields. It is the authorized dealer of German Smaract in China, and independently develops linear motors and air bearing stages. Its AFM ultra-thin ultra-stable linear stage is unique in China, and high-precision air bearing platforms provide domestic high-performance displacement stages for semiconductor inspection.

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