GRE Series Crosshair Reticle GRE21-025B-PCRS
A reticle overlays patterns on images or spatially filters light. Its pattern provides a reference for aligning, positioning, and measuring objects or beams. Positive and negative versions are available. Positive reticles have highly reflective chromium patterns on transparent substrates and are commonly placed at the image plane to overlay the pattern. Negative reticles use the same chromium layer over the substrate, leaving only the pattern transparent, and are used as beam alignment targets or with backlighting or bright illumination. Under backlighting, their patterns can be projected onto dark-field images. See individual model specifications for selection details. Designed for transmission, this series uses UV fused silica, a broadband substrate covering ultraviolet to infrared. Excellent transmission and low birefringence from 193 nm to 2.5 μm suit lasers, precision measurement, and imaging systems.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Outer Diameter | 25.4 mm |
| Net clear aperture | >φ22.9 |
| Thickness | 1.5 mm |
| Graphic | Graduated Crosshair |
| Linewidth | Zone A 2μm; Zone B 10μm |
| Type | Positive |
| Material | UV Fused Silica |
| Coating | Chromium-Coated |
| Blocking Depth [Wavelength 430nm] | ≥OD3@430nm |
| Diameter Tolerance | +0.0/-0.1mm |
| Thickness Tolerance | ±0.1mm |
| Parallelism of both surfaces | <3arcmin |
| Transmitted Wavefront Error [Wavelength 633nm] | <λ@633nm |
| Surface Finish | 60/40 |
| Line Width Error | ±0.5μm |
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Key Features
Datasheet
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