TWE Transmitted Wavefront Error Tester
TWE measurement instruments use dual optical paths for high precision, high dynamic range, and direct measurement of large aberrations, with rapid path switching for transmitted-wavefront characterization and quality control of lenses, filters, and flat glass. Internal and surface inhomogeneity distort the initially planar wavefront of collimated light passing through a component. The TWE tester converts this distortion into detectable intensity-distribution images and reconstructs the complete phase map in real time, quantifying PV, RMS, PSF, and MTF. Absolute accuracy:10nm RMS. Interbench PV difference:below 20nm. Phase test resolution:＜2 nm RMS. Series model:Benchtop TWE Tester.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 400 ~ 1100 nm |
| Aperture Dimension | 5.02 mm × 3.75 mm |
| Spatial Resolution [Depends on Beam Expander] | 27.6 μm (Depends on Beam Expander) |
| Phase Resolution [RMS;Depends on Beam Expander] | <2 nm RMS (Depends on Beam Expander) |
| Inter-Instrument Variation [PV] | PV: 15-20 nm |
| Inter-Instrument Variation [RMS] | RMS: 0-4 nm |
| Absolute Accuracy [RMS] | 10 nm RMS |
| Acquisition Speed | 60 FPS |
| Real-Time Processing Speed [Full Resolution] | 10 FPS (Full Resolution) |
| Electrical Specifications | Power Supply:AC220 V,50 Hz;Power:100 W;Rated Current:0.5 A (Max1A) |
| External Dimensions | 430 mm × 430 mm × 884.5 mm |
| Weight | 55 kg |
| Communication Interface | Ethernet Port, USB 3.0 |
| Air Pressure [Φ10 mm] | 0.5-0.7 Mpa，Φ10 mm |
| Temperature | 15-35°C |
| Humidity | 40 ~ 65% |
| Cleanliness | Class 100/1000/10000 |
Applications
Key Features
Datasheet
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