New Transmission Blazed Grating

Type: Dichroic Mirror Passband: 815-870 nm Stopband: 700-755 nm

Dual-band near-IR imaging dichroic:transmission815-870nm and825-915nm (>90%);blocking700-755nm and940-1100nm (reflectance<0.5%);sharp T=50% transitions at790-810nm and925-945nm. Dimensions16.6(±0.1)×4(±0.2)×1.0(±0.…

Center Wavelength: 1064 nm Center Wavelength Deviation: ±5 Average Power: 15 W

PL (photoluminescence) inspection is a noncontact method based on optical excitation and high-sensitivity camera imaging, widely used for quality inspection of silicon wafers, solar cells and other semiconductor materials. Available power range: 10W; center wavelength: 1064±5nm; half-wave full width: 10nm; series model: 450nm—100W; model (W): 15. These labels are retained as supplied.

Wavelength Range: 400 ~ 1100 nm Aperture Dimension: 5.02 mm × 3.75 mm Spatial Resolution [Depends on Beam Expander]: 27.6 μm (Depends on Beam Expander)

TWE measurement instruments use dual optical paths for high precision, high dynamic range, and direct measurement of large aberrations, with rapid path switching for transmitted-wavefront characterization and quality control of lenses, filters, and flat glass. Internal and surface inhomogeneity distort the initially planar wavefront of collimated light passing through a component. The TWE tester converts this distortion into detectable intensity-distribution images and reconstructs the complete phase map in real time, quantifying PV, RMS, PSF, and MTF. Absolute accuracy:10nm RMS. Interbench PV difference:below 20nm. Phase test resolution:＜2 nm RMS. Series model:Benchtop TWE Tester.

Illumination Angle [Normal Incidence]: 0 degrees ( Normal Incidence ) Output Probe: Collimator;Objectives (4X,10X) Spot Size: ≥ 1.2 mm

The transmittance measuring instrument is a transmission colorimeter measuring material transmittance and color under 0° illumination, suited to industrial inspection and process control. It automatically measures optical-material transmittance/reflectance at multiple angles to calculate transmittance, reflectance, color coordinates and optical film thickness.