10W-1064-01 Silicon Wafer Transmission Inspection Module
PL (photoluminescence) inspection is a noncontact method based on optical excitation and high-sensitivity camera imaging, widely used for quality inspection of silicon wafers, solar cells and other semiconductor materials. Available power range: 10W; center wavelength: 1064±5nm; half-wave full width: 10nm; series model: 450nm—100W; model (W): 15. These labels are retained as supplied.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Center Wavelength | 1064 nm |
| Center Wavelength Deviation | ±5 |
| Average Power | 15 W |
| Typical Working Distance | 10~25 mm |
| Output Aperture Dimensions | 280 mm × 10 mm |
| Inspectable Silicon Wafer Sizes | ≤230 mm |
| Electrical Distribution Requirement | 220 V |
| IO Interface | White 0~24V+ / black 0~0.5V- |
| Average Power Consumption | 150 W |
| Laser Emission Control Method | GUI/coding switch, IO interface |
| Power Adjustment Method | GUI/coding switch |
| Operating Temperature and Humidity | 20~30 ℃ |
| Operating Temperature and Humidity | ＜80% |
| Controller Three-Dimensional Size (L×W×H) | 218 mm × 122 mm × 111 mm |
| Optical Module Three-Dimensional Size (L×W×H) | 316 mm × 33 mm × 138 mm |
| Weight | ≈4 kg |
| Applicable Processes | Bare silicon wafers and textured silicon wafers |
Applications
Key Features
Datasheet
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