Compact Fully Automatic Reflectance Measurement VIS3-350-950
Shanghai Jiepu Technology's fully automatic reflectance system uses an X120mm/Y120mm stage with height adjustment for different sample dimensions. The imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. Nondestructive, fast, accurate measurement serves many industries. Douyin: https://www.douyin.com/user/self?modal_id=7363167072077057280 Bilibili: https://www.bilibili.com/video/BV1sH4y1V7CD/ Transmission/reflection spectroscopy is a fundamental materials-characterization method requiring a visible or near-IR fiber spectrometer, broadband source, UV-resistant fiber, stand and reference sample. Procedure: 1. Turn off source and acquire electronic noise. 2. Turn on, set 100ms exposure, place white reference and acquire reference spectrum. 3. Replace reference with sample and acquire its spectrum. X is wavelength, Y corresponding reflectance.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Wavelength Range | 350-950nm |
| Applicable Applications | Applications Toward the Visible Region |
| Recommended Light Source | Halogen lamp |
| Wavelength Resolution | 2048 channels, 0.3nm spacing (minimum) |
| Detector | CMOS linear array, 2048 pixels, linearity >99.8% |
| Motion Stage | X 120mm,Y 120mm |
| Motion Stage Accuracy | All-Steel Motion Platform, X-Y Accuracy 2um, Positioning Repeatability 5um |
| Continuous Operating Time | Continuous Operation for 4 Hours |
| Mapping Imaging | Supports hyperspectral mapping imaging |
| Image File | Imaging files of approximately 200M are stored on disk without occupying memory; continuous 7*24-hour operation |
| Database | Supports User-Created Databases |
| Material Composition Analysis | Sample composition can be analyzed after building a custom database |
| Illumination Reception | Reflection 90 degrees |
| Spot size | 1-3mm adjustable |
| Measurement Range | Reflectance 0-100% |
| Single Acquisition Time | 0.1 seconds per point; 3000 points over 100mm*100mm in only 4 minutes |
| Wavelength Accuracy | <0.5nm |
| Wavelength Repeatability | 0.1nm |
| Reflectance Accuracy | 0.5% |
| Instrument Repeatability | >99.9% |
| Measurement Parameters | Wavelength-dependent reflectance, average reflectance, reflectance spectrum, reflectance versus time, XY,XYZ,LAB,HSV, UVA, UVB, UVC |
| Circuit | Built-in xenon lamp control circuit |
| Connectors and Data | 30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485 |
| Integration Scheme | Transmittance; absorptance; reflectance; irradiance |
| Self-Recovery Device | 7x24-hour, 365-day continuous operation; built-in watchdog |
| Dimensions | 300 mm × 185 mm × 104 mm |
Applications
Key Features
Datasheet
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