1.6T benchtop bit error analyzer (PBT3058)
The Semight Instruments PBT3058 is a high-performance bit error rate analyzer (BERT) used for high-speed serial signal bit error testing, applicable to physical layer characterization and conformance testing. With support for four-level pulse amplitude modulation (PAM4) and non-return-to-zero (NRZ) signals, and symbol rates up to 106.25GBaud, it covers the 1.6TBASE/CEI-224G standards;; its excellent signal quality (fast rise/fall times, low jitter), rich features (support for FEC error correction code analysis), flexible option configurations, and extremely high system integration provide strong performance and flexibility assurance for pre-research, design, and production testing of high-speed serial circuit products;; users can freely choose different test modes: they can directly insert the DUT into the built-in MCB Kit port on the front panel (lower link signal loss and built-in water cooling), or connect high-speed RF signals to the DUT through an external RF probe;; the programmable pattern generator (PPG) can provide up to 21-stage pre-emphasis adjustment as well as optional nonlinear compensation, flexibly compensating for signal loss during transmission and improving signal quality. The error detector (ED) has a built-in adaptive equalization circuit, ensuring link signal integrity without the need for external active or passive signal conditioning circuits; it also has a built-in fast-locking clock recovery module, ensuring link stability during bit error testing, as well as the accuracy of bit error testing in harsh and complex test environments.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Pattern generator - Output type | Differential PAM4/NRZ |
| Pattern generator - Termination | AC coupled |
| Pattern generator - Output impedance [±10%] | 100 Ω ±10 % |
| Pattern generator - Test pattern | PRBS9/11/13/15/16/23/31; PRBS9Q/11Q/13Q/15Q/16Q/23Q/31Q; SSPRQ, JP03A, JP03B, LINEAR, Square Wave; Custom pattern |
| Pattern generator - Symbol rate (Gbaud) [Extended rate requires EDR option activation] | 24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125/28.2/28.9/30 Gbaud;48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58/58.125/59.37/60 Gbaud;97.32/99.5328/100/103.125/106.25/112/112.2/112.5/112.8/113.4375/115.1/120 Gbaud |
| Pattern generator - Frequency accuracy [typical] | ±50 ppm (typical) |
| Pattern generator - Output amplitude (differential) [Differential; transmitter-side net measured value, default pre-emphasis/de-emphasis parameters] | 800 mVp-p |
| Pattern generator - Rise/fall time (20-80%) | <4.5 ps |
| Optical module test kit - DUT type | OSFP |
| Optical module test kit - Cooling method | Integrated internal water cooling |
| Clock output - Output amplitude [Only RF probe supports trigger clock output] | >300 mVp-p |
| Clock output - Termination (single-ended output) [Single-ended output; only RF probe supports trigger clock output] | AC coupled; MMCX female connector |
| Clock output - Divider ratio [Only RF probe supports trigger clock output] | 4/8/16/32/64/128 |
| Connector | MXPD/SMPS |
| Error detector - Input type | Differential PAM4/NRZ |
| Error detector - Termination | AC coupled |
| Error detector - Input impedance [±10%] | 100 Ω ±10 % |
| Error detector - Receive amplitude (differential) [Differential; receiver-side net measured value; excessively high voltage input may damage the receiver] | Max.800mVp-p |
| Error detector - Receive sensitivity (differential) | 150 mVp-p |
| Error detector - Data pattern | PRBS9/11/13/15/16/23/31;PRBS9Q/11Q/13Q/15Q/16Q/23Q/31Q |
| Error detector - Clock mode | Built-in clock recovery |
| FEC error correction analysis - Analyzer | Hardware FEC analysis, Scrambled Idle pattern |
| FEC error correction analysis - Protocol type | 8x200GKP4/4x400GKP4/2x800GKP4;8x100GKP4/4x200GKP4/2x400GKP4 |
| FEC error correction analysis - Frame loss rate statistics | Support |
| FEC error correction analysis - Margin Alarm | Support |
| Receiver histogram measurement | Support |
| Electrical port signal-to-noise ratio measurement | Support |
| High-precision error acquisition | Support |
| LPO test mode | Support |
| Differential delay adjustment | Support |
| Expandable test probe | Support |
| Environment | For use in indoor facilities |
| Operating conditions | Temperature: 0 °C to +55 °C; Humidity: 30 % to 80 % RH non-condensing |
| Storage conditions | Temperature: -30 °C to +70 °C; Humidity: 10 % to 90 % RH non-condensing |
| Power Supply | Voltage range: 100-240VAC, Frequency range: 50/60 Hz, Maximum power: 250 W |
| Warm-up [After performing automatic calibration, ambient temperature change less than ±3°C] | Warm-up for 10 minutes; after performing automatic calibration, ambient temperature change less than ±3 °C |
| Dimensions | 412 mm × 441 mm × 112 mm |
| Weight [Net weight] | Net Weight 6.5 kg |
Key Features
Datasheet
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