White Light Interference Objective
The white light interference objective fills the gap of ordinary microscope objectives, which can only perform two-dimensional observation and cannot accurately measure height, realizing the integration of two-dimensional defect observation + three-dimensional dimensional measurement of microscopic samples. It can be seamlessly matched with Kohler illumination, telecentric lenses, and defect inspection objectives to build a complete composite optical system for two-dimensional defect detection + three-dimensional topography measurement, fully meeting the high-precision measurement requirements of high-end precision optical inspection equipment.
Overview
Specifications
| Parameter | Value |
|---|---|
| Parfocal distance | 60 mm/45 mm |
| Magnification | 10X,20X,50X |
Applications
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