TF200 Optical Film Thickness Gauge

TF200 Optical Film Thickness Gauge

Supplier
Betops
Part Number
TF200-VIS
Category
Optical Metrology
Origin
China

Semiconductors (SiO2/SiNx, photoresist, MEMS, SOI, etc.) LCD/TFT/PDP (LCD cell gap, polyimide ITO, etc.) LED (SiO2, photoresist ITO, etc.)

Specification Snapshot
Wavelength Range
380-1050nm
Accuracy
2nm
Measurement Mode
Reflection/transmission
Measurement Spot Size
2mm
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Overview

Semiconductors (SiO2/SiNx, photoresist, MEMS, SOI, etc.) LCD/TFT/PDP (LCD cell gap, polyimide ITO, etc.) LED (SiO2, photoresist ITO, etc.)

Specifications

ParameterValue
Wavelength Range380-1050nm
Thickness Range50nm-40um
Accuracy2nm
Accuracy0.2nm
Angle of Incidence90°
Sample MaterialTransparent or translucent
Measurement ModeReflection/transmission
Measurement Spot Size2mm
Whether OnlineYes
Scan SelectionXY optional

Applications

Semiconductors (SiO2/SiNx, photoresist, MEMS, SOI, etc.) LCD/TFT/PDP (liquid crystal cell gap, polyimide ITO, etc.) LED (SiO2, photoresist ITO, etc.); touch screens (ITO AR Coating reflection/transmittance testing, etc.) Automotive (anti-fog layers, Hard Coating DLC, etc.) Medical (parylene-coated balloon/catheter wall thickness, drug films, etc.)

Datasheet

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Supplier Information

Be
Betops
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Guangzhou Betop Scientific Technology Co., Ltd. is a one-stop service manufacturer integrating production, installation, training, and maintenance. For over ten years, it has focused on providing fully automatic contact angle meters, handheld Raman spectrometers, automatic surface tensiometers, domestic surface tensiometers, domestic nano particle size analyzers, and other equipment, with all testing indicators reaching domestic leading and international advanced levels. It also possesses core technical capabilities in optical design, mechanical design, software development, and algorithm writing. Products are widely sold in Beijing, Shanghai, Shenzhen, Zhejiang, Guangdong, Jiangsu, Shandong, and other regions across China.

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TF200 Optical Film Thickness Gauge
Betops · Optical Metrology
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