VR Lens Stress Birefringence Measurement System

VR Lens Stress Birefringence Measurement System

Supplier
Oelectron
Category
Optical Metrology
Origin
China

PHL stress birefringence instruments are widely used in the industry to evaluate lens stress birefringence and reduce ghost images. Building on market requirements and accumulated expertise, PHL introduced the WPA-VR specifically for evaluating birefringence in pancake lenses, for both research and production lines.

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Overview

PHL stress birefringence instruments are widely used in the industry to evaluate lens stress birefringence and reduce ghost images. Building on market requirements and accumulated expertise, PHL introduced the WPA-VR specifically for evaluating birefringence in pancake lenses, for both research and production lines.

Specifications

ParameterValue
Measurement wavelength470nm, 540nm,650nm( Customizable )
maximum Measurement Field of ViewApproximately 100 mmx160 mm
PixelApproximately 2,500x2,000pixels
Output DataCloth 、 relative Axis Square Positions ; Retardance Distribution 、 Stokes parameter S; Minutes
Reproducibility6<0.1nm( Retardance Measurement When )
Structurebody 、 Dedicated Control Computer 、 Dedicated Software Items 、 Operating Manual
body Dimensions / WeightApproximately 300x350x600 mm /15kg

Key Features

1. Full field measurement of Stokes parameter S3. Thin pancake lenses combine a polarizer and QWP (quarter wave plate) to control overall polarization. Mapping S3 across the surface evaluates polarization control and reveals wrinkles, bubbles and other defects in bonded materials. 2. RGB primary color measurements evaluate QWP retardance and the source-described S; differences for each color, helping optimize image color reproduction and reduce ghosting. 3. Full field lens retardance (stress birefringence) measurement. Pancake lenses require minimal retardance variation; the greater retardance near the injection gate makes control of this region important. 4. Measurement of the relative axes of the polarizer and QWP. Ideally, the polarizer transmission axis and QWP retardance axis are 45 degrees apart. The equipment measures deviations from this relative angle during mass production or sampling inspection.

Datasheet

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Supplier Information

Oe
Oelectron
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Beijing Optic Electronic Technology Co., Ltd. (Optic Electronic) was founded in 2010. It is a high-tech enterprise focusing on the optoelectronic field, providing domestic scientific research institutions and industrial users with instruments, equipment and overall solutions in optical inspection, micro-nano processing, laser applications and other fields. The company is headquartered in Changping, Beijing, with offices in Shanghai and Guangzhou, serving the whole country. Beijing Optic Electronic Technology Co., Ltd. (Optic Electronic) was founded in 2010 and has been deeply engaged in the optoelectronic field for more than ten years, focusing on introducing and promoting mature and innovative optoelectronic technologies and reliable products from overseas, and providing professional instruments, equipment and supporting services for domestic scientific research institutions and industrial enterprises. Its products cover optical inspection and analysis, laser and micro-nano processing, semiconductor packaging inspection, physical property analysis, and special optical fibers and crystals, and are widely used in semiconductor manufacturing, materials science, biomedicine, university research and national defense.

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VR Lens Stress Birefringence Measurement System
Oelectron · Optical Metrology
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