Atomic Force Microscope - Tosca Tosca 200
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Specifications
| Parameter | Value |
|---|---|
| Scanner - X-Y Scan Range | 50 µm x 50 µm* |
| Scanner - Z Scan Range | 10 µm** |
| Maximum Scan Speed | 5lines/s |
| Maximum Sample Diameter | 45 mm |
| Maximum Sample Height | 25 mm |
| Maximum Sample Weight | <600 g |
| Automated Platform - X-Y Stage | 100 mm Travel |
| Automated Platform - Z Stage | 85 mm Travel |
| Automated Platform - Positioning Repeatability [Unidirectional] | <1 µm |
| Video Microscope - Camera | Color, 5 million Pixels, CMOS Sensor |
| Video Microscope - Field of View | 1.73 mm x 1.73 mm |
| Video Microscope - Spatial Resolution | 5 µm |
| Video Microscope - Focusing | Autofocus |
| Overview Camera - Camera | Color, 5 million Pixels, CMOS Sensor |
| Overview Camera - Field of View | 40 mm x 40 mm |
| Overview Camera - Spatial Resolution | 50 µm |
| Side-View Camera | Monochrome, Field-of-View Diameter Approximately 30 mm |
| Standard Mode | Contact Mode, Tapping Mode (Including Phase Imaging), Lateral Force Microscopy, Force-Distance Curves |
| Optional Mode | Contact Resonance Amplitude Imaging |
| AFM Unit Dimensions (Length×Width×Height) | 490 mm x 410 mm x 505 mm |
| Controller Dimensions (Length×Width×Height) | 340 mm x 305 mm x 280 mm |
| AFM Unit Weight | 51.1 kg |
| Controller Weight | 7.8 kg |
Datasheet
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Supplier Information
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