Michelson Interferometer System GW-EDU-INTE-010

Michelson Interferometer System GW-EDU-INTE-010

Supplier
Goldway
Part Number
GW-EDU-INTE-010
Category
Interferometers
Origin
China

Interferometers are optical devices demonstrating interference. They use wave superposition to obtain phase information from amplitude and characterize physical quantities. The source describes the Michelson interferometer as a precision instrument jointly designed by American physicists Michelson and Morley in 1881 to study ether drift. It divides amplitude into two beams for interference and can be adjusted to generate equal-thickness or equal-inclination fringes. The source states that Michelson and Morley received the 1907 Nobel Prize in Physics for these achievements. Applications include: 1. Length and refractive index measurement: with constant refractive index, fringe movement reflects changes in path length difference, allowing length measurement from fringe counts. With constant distance, refractive index changes move fringes and enable index calibration. 2. Beam wavelength measurement: fringe changes depend on the optical path difference between coherent beams. With other quantities fixed, incident wavelength is proportional to optical path and can be calculated from fringes.

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Overview

Interferometers are optical devices demonstrating interference. They use wave superposition to obtain phase information from amplitude and characterize physical quantities. The source describes the Michelson interferometer as a precision instrument jointly designed by American physicists Michelson and Morley in 1881 to study ether drift. It divides amplitude into two beams for interference and can be adjusted to generate equal-thickness or equal-inclination fringes. The source states that Michelson and Morley received the 1907 Nobel Prize in Physics for these achievements. Applications include: 1. Length and refractive index measurement: with constant refractive index, fringe movement reflects changes in path length difference, allowing length measurement from fringe counts. With constant distance, refractive index changes move fringes and enable index calibration. 2. Beam wavelength measurement: fringe changes depend on the optical path difference between coherent beams. With other quantities fixed, incident wavelength is proportional to optical path and can be calculated from fringes.

Specifications

ParameterValue
Optical FlatDimensions 300×300×13mm
LaserWavelength and Power Options Available
MirrorDiameter 25.4mm
Beamsplitter PrismDimensions 25.4×25.4×25.4mm

Applications

Length measurement; refractive index measurement; beam wavelength measurement; teaching and research; exhibitions; science education.

Key Features

1. Suitable for Teaching, Research, Demonstration and Science Outreach 2. Detailed Operating Guide Provided 3. Easy to Assemble and Use

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Supplier Information

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Goldway
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Beijing Opute Technology Co., Ltd., founded in 1998, is an innovative technology company specializing in the promotion, R&D, production, and sales of optical technologies and products. Headquartered in Zhongguancun Electronic Science and Technology Park, Beijing, with branches nationwide, the company focuses on the design, development, and processing of optomechanical components, optical lenses, and optical systems, as well as the sales of precision optical instruments and the development of spectral imaging systems. With solid R&D capabilities and strong production and testing technologies, it has been certified as a High-Tech Enterprise. Adhering to the culture of 'Thinking Further Shining Future,' Opute provides high-quality products and services to meet customer application needs, striving to become a professional optomechanical component and optical instrument system integrator in China.

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Michelson Interferometer System GW-EDU-INTE-010
Goldway · Interferometers
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