Tera2101 10G/25G/40G/100G test and development board
The Tera2101 is a 10G/25G/40G/100G test-development board supporting two module-test paths: First, 40G/100G QSFP+/QSFP28; second, 10G/25G SFP+/SFP28.
Specification Snapshot
Data Rate [Performance Parameter Table]
9~30 Gb/s
Operating Temperature [Performance Parameter Table]
-5~55 ºC
Storage temperature [Performance Parameter Table]
-10~70 ºC
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Overview
The Tera2101 is a 10G/25G/40G/100G test-development board supporting two module-test paths: First, 40G/100G QSFP+/QSFP28; second, 10G/25G SFP+/SFP28.
Specifications
| Parameter | Value |
|---|---|
| Data Rate [Performance Parameter Table] | 9~30 Gb/s |
| Power Supply [Performance Parameter Table] | typical:8.5 V(DC) |
| Power Supply [Performance Parameter Table] | 5~9 V(DC) |
| Total Unit Power Consumption [Performance Parameter Table] | ≤2 W |
| Operating Temperature [Performance Parameter Table] | -5~55 ºC |
| Storage temperature [Performance Parameter Table] | -10~70 ºC |
| Humidity [Performance Parameter Table; Non-Condensing] | 5~90 % |
| RF interface [Performance Parameter Table] | K (2.92mm), compatible with SMA |
| Power Supply [Main feature text; Differs from the table's lower limit] | 7~9 V |
| Number of RF interface channels [First path; 40G/100G QSFP+/QSFP28] | 4 channels |
| Supported RF interface rate [First path; 40G/100G QSFP+/QSFP28] | 10~28 Gb/s |
| Number of RF interface channels [Second path; 10G/25G SFP+/SFP28] | 1 channels |
| Supported RF interface rate [Second path; 10G/25G SFP+/SFP28] | 10~28 Gb/s |
Applications
Each RF interface supports 10G/11G/12G/14G/22G/24.3G/25.7G/28.05Gb/s. Main uses are development tests of 10GE/16GFC/25GE/40GE/CPRI/100GE/128GFC optical modules and AOC. Combined with Tera2100-OE, it tests 10G/25G optical eye diagrams.
Key Features
Compact chassis with a 7~9V supply monitored through network management and panel indicators. The first path for 40G/100G QSFP+/QSFP28 supports 4 RF channels at 10G~28Gb/s. The second path for 10G/25G SFP+/SFP28 supports one RF channel at 10G~28Gb/s. K RF connectors also accept SMA. The bit-error tester is PC-controlled, with its module interface shown below.
Datasheet
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Supplier Information
Shenzhen Terawan Technology is a high-tech enterprise in Shenzhen, focusing on providing customers with precision optoelectronic packaging and precision high-speed optoelectronic testing solutions. Products cover 1~10G six-channel bit error rate tester, 10~100G optoelectronic bit error rate tester, 100~400G PAM4 bit error rate tester, HDMI test bit error rate tester, four-channel adjustable optical attenuator, dual-channel 1:4 optical switch, 10G/40G/25G/100G AOC integrated test system, optical module automated test system, automatic temperature control system, 10G/25G COB automated coupling system, 40G/100G COB automated coupling system, 200G/400G COB automated coupling system, BOX Lens automated coupling system, AWG/FA automated coupling system, HDMI COB automatic coupling equipment. Optical module customization solutions, SOA semiconductor amplifier systems, aiming to provide high-quality testing and production services for customers in the optoelectronic field (optical engines, optical modules, active optical cables), etc.
The company team is composed of a group of senior professionals in communications, electronic technology and management. The company has provided customers with 10G optical decoding transmission systems, multi-channel SOA amplifiers, COB automated coupling equipment, 100G optoelectronic bit error rate testers and 10~100G optical module analyzers and many other systems and test products. In high-speed optical transmission systems, high-speed optical module detection and testing, COB coupling packaging/LENS coupling packaging, etc., it has achieved numerous scientific and technological achievements and obtained multiple national patents and software copyrights. It has strong R&D capabilities in technical fields such as optical transmission systems, high-speed optical modules, high-speed circuit design, and automated instruments.
Products include:
(1) 10G/25G/40G/100G optical module tester (Tera2140);
(2) 100~400G PAM4 bit error rate tester (Tera2400);
(3) 10~100G optoelectronic bit error rate tester (Tera2100);
(4) 1~10G six-channel bit error rate tester (Tera2060);
(5) HDMI active optical cable bit error rate tester (Tera2060-5);
(6) 10G/25G/40G/100G optical module automated test platform (Tera2000);
(7) 10G/25G/40G/100G active optical cable test platform;
(8) Multi-channel adjustable optical attenuator
(9) Multi-channel 1:4 optical switch
(10) TEC automatic temperature control system
(11) 10G/25G dual-lens COB automatic coupling station (Tera3001-S)
(12) 40G/100G multi-channel COB automatic coupling station (Tera3001-Q)
(13) 200G/400G multi-channel COB automatic coupling station (Tera3001-E)
(14) HDMI multi-channel COB automatic coupling station (Tera3001-H)
(15) BOX LENS automatic coupling station (Tera3002-L)
(16) AWG automatic coupling station (Tera3002-C)
(17) TO automatic coupling welding station (Tera3003)
(18) 100GE SOA semiconductor amplifier (Tera2000);
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