Tera2101 10G/25G/40G/100G test and development board

Tera2101 10G/25G/40G/100G test and development board

Supplier
Terawan
Category
Posts and Post Holders
Origin
China

The Tera2101 is a 10G/25G/40G/100G test-development board supporting two module-test paths: First, 40G/100G QSFP+/QSFP28; second, 10G/25G SFP+/SFP28.

Specification Snapshot
Data Rate [Performance Parameter Table]
9~30 Gb/s
Operating Temperature [Performance Parameter Table]
-5~55 ºC
Storage temperature [Performance Parameter Table]
-10~70 ºC
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Overview

The Tera2101 is a 10G/25G/40G/100G test-development board supporting two module-test paths: First, 40G/100G QSFP+/QSFP28; second, 10G/25G SFP+/SFP28.

Specifications

ParameterValue
Data Rate [Performance Parameter Table]9~30 Gb/s
Power Supply [Performance Parameter Table]typical:8.5 V(DC)
Power Supply [Performance Parameter Table]5~9 V(DC)
Total Unit Power Consumption [Performance Parameter Table]≤2 W
Operating Temperature [Performance Parameter Table]-5~55 ºC
Storage temperature [Performance Parameter Table]-10~70 ºC
Humidity [Performance Parameter Table; Non-Condensing]5~90 %
RF interface [Performance Parameter Table]K (2.92mm), compatible with SMA
Power Supply [Main feature text; Differs from the table's lower limit]7~9 V
Number of RF interface channels [First path; 40G/100G QSFP+/QSFP28]4 channels
Supported RF interface rate [First path; 40G/100G QSFP+/QSFP28]10~28 Gb/s
Number of RF interface channels [Second path; 10G/25G SFP+/SFP28]1 channels
Supported RF interface rate [Second path; 10G/25G SFP+/SFP28]10~28 Gb/s

Applications

Each RF interface supports 10G/11G/12G/14G/22G/24.3G/25.7G/28.05Gb/s. Main uses are development tests of 10GE/16GFC/25GE/40GE/CPRI/100GE/128GFC optical modules and AOC. Combined with Tera2100-OE, it tests 10G/25G optical eye diagrams.

Key Features

Compact chassis with a 7~9V supply monitored through network management and panel indicators. The first path for 40G/100G QSFP+/QSFP28 supports 4 RF channels at 10G~28Gb/s. The second path for 10G/25G SFP+/SFP28 supports one RF channel at 10G~28Gb/s. K RF connectors also accept SMA. The bit-error tester is PC-controlled, with its module interface shown below.

Datasheet

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Supplier Information

Te
Terawan
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Shenzhen Terawan Technology is a high-tech enterprise in Shenzhen, focusing on providing customers with precision optoelectronic packaging and precision high-speed optoelectronic testing solutions. Products cover 1~10G six-channel bit error rate tester, 10~100G optoelectronic bit error rate tester, 100~400G PAM4 bit error rate tester, HDMI test bit error rate tester, four-channel adjustable optical attenuator, dual-channel 1:4 optical switch, 10G/40G/25G/100G AOC integrated test system, optical module automated test system, automatic temperature control system, 10G/25G COB automated coupling system, 40G/100G COB automated coupling system, 200G/400G COB automated coupling system, BOX Lens automated coupling system, AWG/FA automated coupling system, HDMI COB automatic coupling equipment. Optical module customization solutions, SOA semiconductor amplifier systems, aiming to provide high-quality testing and production services for customers in the optoelectronic field (optical engines, optical modules, active optical cables), etc. The company team is composed of a group of senior professionals in communications, electronic technology and management. The company has provided customers with 10G optical decoding transmission systems, multi-channel SOA amplifiers, COB automated coupling equipment, 100G optoelectronic bit error rate testers and 10~100G optical module analyzers and many other systems and test products. In high-speed optical transmission systems, high-speed optical module detection and testing, COB coupling packaging/LENS coupling packaging, etc., it has achieved numerous scientific and technological achievements and obtained multiple national patents and software copyrights. It has strong R&D capabilities in technical fields such as optical transmission systems, high-speed optical modules, high-speed circuit design, and automated instruments. Products include: (1) 10G/25G/40G/100G optical module tester (Tera2140); (2) 100~400G PAM4 bit error rate tester (Tera2400); (3) 10~100G optoelectronic bit error rate tester (Tera2100); (4) 1~10G six-channel bit error rate tester (Tera2060); (5) HDMI active optical cable bit error rate tester (Tera2060-5); (6) 10G/25G/40G/100G optical module automated test platform (Tera2000); (7) 10G/25G/40G/100G active optical cable test platform; (8) Multi-channel adjustable optical attenuator (9) Multi-channel 1:4 optical switch (10) TEC automatic temperature control system (11) 10G/25G dual-lens COB automatic coupling station (Tera3001-S) (12) 40G/100G multi-channel COB automatic coupling station (Tera3001-Q) (13) 200G/400G multi-channel COB automatic coupling station (Tera3001-E) (14) HDMI multi-channel COB automatic coupling station (Tera3001-H) (15) BOX LENS automatic coupling station (Tera3002-L) (16) AWG automatic coupling station (Tera3002-C) (17) TO automatic coupling welding station (Tera3003) (18) 100GE SOA semiconductor amplifier (Tera2000);

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