SR-Mapping Reflectometric Film Thickness Meter

SR-Mapping Reflectometric Film Thickness Meter

Supplier
Whyg88
Category
Optical Metrology
Origin
China

SR-Mapping Reflectometric Film Thickness Meter Series Use the principle of reflex intervention None Damage measurement , Reflecting spectrum by analysing reflections of thin film surfaces and reflections of film with substrate interfaces , Also Used with R-Theta Move table , Compatibility 6 Present. 12 Samples inches , We can scan the entire sample quickly. , Rapidly measure the thinness of the film 、 Optical constants, etc. , And evaluate the membrane thickness. 。

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Overview

SR-Mapping Reflectometric Film Thickness Meter Series Use the principle of reflex intervention None Damage measurement , Reflecting spectrum by analysing reflections of thin film surfaces and reflections of film with substrate interfaces , Also Used with R-Theta Move table , Compatibility 6 Present. 12 Samples inches , We can scan the entire sample quickly. , Rapidly measure the thinness of the film 、 Optical constants, etc. , And evaluate the membrane thickness. 。

Applications

Widely applied to various media protection film 、 Organic film 、 None Smash 、 Metal Membrane 、 Scratch measurements, etc. 。

Key Features

■ Optical thin membrane measurement solutions ; ■ Non-contact 、 Non-destructive measurements ; ■ Core algorithms support thin membranes to thick membranes. 、 Single to multilayer film analysis ; ■ Repetitive measurement precision of film thickness :0.02nm ■ Full AutoSeparation , The number of measurements and the position are in place. Recipe Edit as you want ■ High-intensity halogen light source , Spectrocover Ultraviolet Visible Light Close Infrared Scope ; ■ Integrated design for PV-level integration , Small , Easy to operate. ; ■ Reflective photo-interferometry based on upper- and lower-level membranes , Easy to decipher the monofilm to multiple layers. ; ■ Configuration * Core analytical algorithm :FFT Analyse the thick film 、 Curve-compatible analysis of the physical parameters of thin film information

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Supplier Information

Wh
Whyg88
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Wuhan Eoptics Technology Co., Ltd. is a high-tech enterprise in China specializing in the research, development, manufacturing and sales of ellipsometers and optical nano-measurement equipment. The company was jointly founded by several experts with more than 20 years of experience in polarization optical measurement and works closely with Huazhong University of Science and Technology, making it a highly competitive technical team in the field of ellipsometric optical instruments in China. Registered in the East Lake National Independent Innovation Demonstration Zone in Wuhan, the company is based in Optics Valley and serves the world, providing comprehensive solutions including instruments, software and services for scientific research and industrial users. Wuhan Eoptics products cover ellipsometers, automatic ellipsometers, spectroscopic ellipsometers, Mueller matrix ellipsometers, ellipsometers, ellipsometric thickness gauges, ellipsometric spectrometers, spectral film thickness gauges, reflection film thickness gauges, film thickness analyzers, optical thickness gauges, infrared thickness gauges, automatic film thickness gauges, spectral film thickness testers, etc., which are widely used in integrated circuits, semiconductors, photovoltaic solar energy, flat panel displays, LED lighting, storage, biology, medicine, chemistry, electrochemistry, optical coating, lithography materials, universities, scientific research and many other fields.

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SR-Mapping Reflectometric Film Thickness Meter
Whyg88 · Optical Metrology
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