Beam'R2 Series Slit-Scanning Beam Quality Analyzer
Beam'R2 suits diverse beam analysis. With standard2.5μm slits/larger knife edges,Beam'R2 measures beams down to2μm. Silicon,InGaAs or extended InGaAs let Beam'R2 cover190 nm to2500 nm. Beam'R2 scanning slits offer higher resolution than camera systems.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Wavelengths [Si Detector] | 190 至 1150 nm |
| Wavelengths [InGaAs Detector] | 650 至 1800 nm |
| Wavelengths [Si + InGaAs Detector] | 190 至 1800 nm |
| Wavelengths [Si + InGaAs (extended) detector] | 190 to 2300 or 2500 nm |
| Scanning Beam Diameter [Si Detector] | 5 µm to 4 mm in knife-edge mode, down to 2 µm |
| Scanning Beam Diameter [InGaAs Detector] | 10 µm to 3 mm in knife-edge mode, down to 2 µm |
| Scanning Beam Diameter [InGaAs (extended) detector] | 10 µm to 2 mm in knife-edge mode, down to 2 µm |
| Beam Waist Diameter Measurement | Second-moment (4s) diameter in accordance with ISO 11146; fitted Gaussian and TopHat; 1/e² (13.5%) width; user-selectable percentage of peak; knife-edge mode for very small beams |
| Measurement Source | Continuous and quasi-continuous beams |
| Resolution Accuracy | 0.1 µm or 0.05% of the scan range; ± < 2% ± = 0.5 µm |
| Maximum Power [Total] | 1 W |
| Maximum Irradiance | 0.5 mW/µm² |
| Gain Range | 1‚000:1 Switch ;4‚096:1 ADC Range |
| Displayed Graphs | XY positions and profiles, zoom x1 to x16 |
| Update Rate | ~5 Hz, adjustable from 2 to 10 Hz |
| Pass/Fail Display | Selectable pass/fail colors on screen. Ideal for QA and production. |
| Averaging | User-selectable running average (1 to 8 samples) |
| Statistics | Minimum, maximum, mean, standard deviation; records data over longer periods |
| XY Profiles and Centroid | Beam drift display and recording |
| Minimum Requirements | Windows 10 64 bits |
Applications
Key Features
Datasheet
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Supplier Information
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