Quartz Crystal
Quartz consists primarily of SiO₂. It has low stress birefringence and a high mean refractive index, with a main application band of 200~2500nm. Its excellent optical properties support wide use in the electronics industry, precision optics and optical communication equipment.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Growth Method | Hydrothermal method |
| Crystal Structure | Hexagonal |
| Lattice Constant | a=4.914Å c=5.405 Å |
| Melting Point | 1610℃ (phase transition point: 573.1℃) |
| Density | 2.684g/cm3 |
| Hardness | 7（mohs） |
| Hot-melt | 0.18cal/gm |
| Thermal Conductivity | 0.0033cal/cm℃ |
| Thermoelectric Constant | 1200uv/℃（300℃） |
| Refractive Index | 1.544 |
| Coefficient of Thermal Expansion | α11：13.71×106/ ℃ α33：7.48×106 /℃ |
| Q Value | 1.8 min × 106 min |
| Sound Velocity, Surface-Acoustic Grade | 3160（m/sec） |
| Frequency Constant | 1661（kHz/mm） |
| Piezoelectric Coupling | K2(%) BAW: 0.65 SAW: 0.14 |
| Crystal Orientation | Y, X or Z cut, rotated to any value within 30º~42.75 º ±5 arcmin; primary flat: orientation to customer requirements ±30 arcmin; secondary flat: orientation to customer requirements; seed crystal: centered, width <5mm, height >66mm |
| Polished Surface | Epitaxial polishing: single- or double-side polishing, Ra<10Å; working area: substrate diameter -3mm; bow: Φ3″<20um, Φ4″<30um; no chipping in the working area; edge chipping width <0.5mm; pits and scratches: <3 per piece, <20 per 100 pieces |
| Standard Thickness | 0.5mm±0.05mm TTV<5um |
| Standard Diameter | Φ2″(50.8mm), Φ3″(76.2mm), Φ4″(100mm)±0.2mm; primary flat: 22±1.5mm (Φ3″), 32±3.0 (Φ4″); secondary flat: 10mm±1.5mm |
Datasheet
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Supplier Information
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