Quasi-Fermi Level Splitting Imaging System QV-Micro
QFLSVision™ is a quasi-Fermi-level splitting(QFLS) imaging system for thin-film photovoltaic cells. Systematic irradiance calibration and integrated algorithms provide absolute emission spectra, PLQY/ELQY, QFLS, Pseudo JV, and area photographic imaging. It visualizes film uniformity and defect distributions, supporting understanding of failure mechanisms in perovskite photovoltaic cells.
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Overview
QFLSVision™ is a quasi-Fermi-level splitting(QFLS) imaging system for thin-film photovoltaic cells. Systematic irradiance calibration and integrated algorithms provide absolute emission spectra, PLQY/ELQY, QFLS, Pseudo JV, and area photographic imaging. It visualizes film uniformity and defect distributions, supporting understanding of failure mechanisms in perovskite photovoltaic cells.
Specifications
| Parameter | Value |
|---|---|
| Functions | PL/EL Spectra, QFLS, Equivalent Photovoltaic Current Density–Voltage Curves(Pseudo JV);White-Light, PL, EL, PLQY/ELQY, QFLS, and Optical PCE Imaging;V_OC Loss Analysis |
| PLQY / ELQY Measurement Range | 0.01~100% |
| PL Detection Band -450nm Excitation | 550~1050nm(Imaging);550~1600nm(Spectroscopy) |
| PL Detection Band -800nm Excitation | 880~1050nm(Imaging);880~1600nm(Spectroscopy) |
| EL Detection Band | 400~1050nm |
| Imaging Area [@100X;@10X;Scaled Proportionally for Other Objectives] | ≥85μm × 85μm @ 100X; ≥850μm × 850μm @ 10X; Scales Proportionally for Other Objectives |
| Spatial Resolution [@10X Objective & PL/EL Peak 800nm <2.5μm;@10X Objective &450nm Imaging <1.5μm;@100X Objective & PL/EL Peak 800nm <1μm;@100X Objective &450nm Imaging] | <5μm @10X Objective & PL/EL Peak 800nm <2.5μm @10X Objective &450nm Imaging <1.5μm @100X Objective & PL/EL Peak 800nm <1μm @100X Objective &450nm Imaging |
| Imaging Method | Area Photographic Imaging |
| Objective Configuration | 10X、20X、50X、100X |
| Spectrometer - Visible Spectrometer - Wavelength Range | 325~1100nm |
| Spectrometer - Visible Spectrometer - Pixel Spacing | < 1nm |
| Spectrometer - Visible Spectrometer - Quantum Efficiency | Peak QE~95% |
| Spectrometer - Visible Spectrometer - Cooling Temperature | 40℃ Below Room Temperature |
| Spectrometer - Visible Spectrometer - Signal-to-Noise Ratio | 1000:1(At Saturation) |
| Spectrometer - Visible Spectrometer - Dynamic Range | 10000:1 |
| Camera - Pixel Count | 5472 (H) × 3648 (V) |
| Camera - Quantum Efficiency [@ 495nm] | 84% @ 495nm |
| Excitation Source - Illumination Intensity | 0.001~20Suns |
| Excitation Source - Filter Settings | 6 Motorized Adjustable Settings |
Applications
Recombination-loss analysis: quasi-Fermi level splitting (QFLS) is an important indicator of internal recombination losses in perovskite solar cells. QFLSVision™ measures QFLS layer by layer and supports QFLS Mapping, providing key data for process optimization. Thin-film solar-cell uniformity characterization: PLQY/ELQY/QFLS imaging more faithfully reflects the optoelectronic uniformity of perovskite films; uniformly formed solar cells generally have better stability and efficiency. Testing single-junction and tandem thin-film photovoltaic cells: their bandgap and film requirements differ; QFLSVision™ uses dual excitation channels to test different perovskite photovoltaic cells and assist high-efficiency cell design. PCE prediction without complete devices: PCE directly reflects device performance; QFLSVision™ predicts potential optical PCE without complete devices to assist high-performance perovskite photovoltaic device development. Applications of deep spectroscopy in photovoltaics and optoelectronics.
Key Features
Multiple functions: QFLSVision™ is an optical imaging inspection system designed for thin-film solar cells, measuring important photovoltaic parameters including PL / EL, PLQY / ELQY, QFLS, Pseudo jV, QFLS imaging, PCE imaging and fluorescence peak-position distribution imaging. Imaging within seconds: rapidly detects three-dimensional spatial and intensity distributions and performs point-scan imaging of optoelectronic devices according to a Recipe. Quantitative imaging: irradiance calibration and built-in algorithms enable quantitative imaging and comparison of different samples across time and space. Testing without complete devices: measures QFLS distributions layer by layer after thin-film processing in films and partial devices, directly evaluating bulk and interface recombination losses and corresponding defect distributions. External-bias imaging: supports electroluminescence quantum yield ELQY imaging; different biases evaluate the distribution of recombination losses during carrier transport for diverse testing needs.
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Supplier Information
Shanghai Ideaoptics Co., Ltd. is a national-level specialized and sophisticated 'Little Giant' enterprise, a deep-spectrum technology innovator. Devoted to the micro-nano optoelectronic field, it develops intelligent full-spectrum technology integrating photonics and AI, building an internationally leading deep-spectrum platform. The company provides comprehensive solutions from technology to products, including micro spectrometers, angle-resolved spectrometers, and confocal Raman spectrometers, widely applied in IC chips, optical chips, biochips, AR/VR, and advanced displays. Through joint R&D centers with universities, Ideaoptics continuously launches breakthrough products, serving over 3,000 customers and cooperating with 170+ semiconductor, advanced materials, and biomedical enterprises, aiming to advance photonic integration and empower semiconductor manufacturing.
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