TopSPM-AD Atomic Force Microscope with Self-Sensing Probe
The product originated from the State Key Laboratory of Optoelectronic Materials and Technologies at Sun Yat-sen University. Its technology has reached the level of internationally advanced products, with research achievements overcoming international restrictions and technical barriers. The team maintains long-term collaborations with the Guangdong Integrated Circuit Engineering Technology Research Center, the Guangdong Green Power Conversion and Intelligent Control Engineering Technology Research Center, the School of Physics and the testing center at Sun Yat-sen University, other universities and research institutes, and leading domestic companies in related fields. Its expertise covers surface analysis, weak-signal detection, measurement and control system design, and instrument development and production.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Scanner Type | Closed Loop |
| Sample Introduction Method | Automatic Sample Introduction with Adjustable Sample Measurement Position |
| Probe Holder Type | AK/AD (Self-Sensing) / Las (Laser-Detected) |
| Travel | 23 mm |
| Minimum Step Size | 50 nm |
| Maximum Sample Diameter | 20 mm |
| Maximum Sample Thickness | 20 mm |
| Maximum Scan Range [Closed Loop] | Approximately 30×30×8 |
| Resolution [Closed Loop] | Approximately 1.5 |
| Imaging Rate | 0.1–30 lines/s |
| Image Resolution | 1024 physical pixels × 1024 physical pixels |
| Digital PID Feedback Control Response Time | 10 μs |
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