Fully Automatic Microscopic Hyperspectral Inspection Instrument
The fully automatic microscopic hyperspectral inspection instrument combines an automatic microscope and stage with minimum positioning accuracy of 1um and a 200-1100nm spectrometer. It detects reflectance of small lenses and metal or liquid contaminants. A 100um spot supports micro-area inspection.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Detector Grating [Effective Dimensions] | 600gl/mm 12.5mm*12.5mm(Effective Dimensions) |
| Measurement Distance to the Object | 10mm |
| Detector | CMOS linear array, 2048 pixels, linearity >99.8% |
| Reflectance Error | <0.5% |
| Stage Translation Range [Travel Can Be Customized] | 150mm * 150mm, Travel Can Be Customized |
| Detector Dark noise | 30cnts |
| Analog-to-Digital Sampling Chip [2MHz（ Max ）] | 16-bit, 2MHz (maximum) |
| Exposure Time | 0.06 ms-65m |
| Measurement Repeatability （GRR） | >98% |
| Fiber interface | SMA905 |
| Measurement Time | 20*20, Total 400 Points, 3 Minutes; 20*50, Total 1000 Points, 4 Minutes |
| Halogen lamp | 360nm-2500nm Wavelength Range |
| Connectors and Data | 30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485 |
| Detector Wavelength Range | 350-1000nm |
| Measurement Spot | Diameter 1mm， With a Microscope the Spot Can Reach 30um |
| Stage Translation Resolution [Min Resolution] | 2um Min Resolution |
Applications
Key Features
Datasheet
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Supplier Information
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