Microscale Reflectance Measurement System VIS3-200-800

Microscale Reflectance Measurement System VIS3-200-800

Supplier
Jnewtech
Part Number
VIS3-200-800
Category
Optical Metrology
Origin
China

Shanghai Jiepu Technology's microscale transmission/reflection measurement system uses a ratio method to determine spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast and highly accurate measurements. A measured spot size of 50um enables transmittance and reflectance testing of small objects, and an automatic stage supports planar scanning. Reflection measurement procedure: 1. Switch off the source and acquire the spectrometer's electronic noise. 2. Switch on the source, set exposure to 100ms, place a white reference and acquire the reference spectrum. 3. Remove the white reference, place the sample and acquire its spectrum. The X axis shows wavelength and the Y axis shows the corresponding reflectance.

Specification Snapshot
Wavelength Range
200-800nm
Wavelength Accuracy
<0.5nm
Measurement Parameters
Wavelength Reflectance, Average Reflectance, Reflectance Spectrum, Reflectance versus Time; XY, XYZ, LAB, HSV, UVA, UVB, UVC
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Overview

Shanghai Jiepu Technology's microscale transmission/reflection measurement system uses a ratio method to determine spectral reflectance. Its integrated imported tungsten-halogen lamp operates continuously for 2000 hours with stability >99.99%. The system provides nondestructive, fast and highly accurate measurements. A measured spot size of 50um enables transmittance and reflectance testing of small objects, and an automatic stage supports planar scanning. Reflection measurement procedure: 1. Switch off the source and acquire the spectrometer's electronic noise. 2. Switch on the source, set exposure to 100ms, place a white reference and acquire the reference spectrum. 3. Remove the white reference, place the sample and acquire its spectrum. The X axis shows wavelength and the Y axis shows the corresponding reflectance.

Specifications

ParameterValue
Wavelength Range200-800nm
Recommended Light SourceFlashing Xenon Lamp
DetectorCMOS linear array, 2048 pixels, linearity >99.8%
Operating ModeSingle acquisition/continuous acquisition/external triggering
Exposure Time0.06 ms-65m
Optical slit [25um( Default )]25um( Default )/ 50um / 100um,200um
Illumination ReceptionReflection 90 degrees
Measurement RangeReflectance 0-100%
Single Acquisition Time0.01 s
Wavelength Accuracy<0.5nm
Reflectance Accuracy0.5%
Instrument Repeatability>99.9%
Continuous Operating TimeCan operate continuously for 6 hours
Mapping ImagingSupports hyperspectral mapping imaging
Measurement ParametersWavelength Reflectance, Average Reflectance, Reflectance Spectrum, Reflectance versus Time; XY, XYZ, LAB, HSV, UVA, UVB, UVC
CircuitBuilt-in xenon lamp control circuit
Connectors and Data30PIN connector, including USB (480Mbps)/TTL (3.3v)/RS232/485
Integration SchemeTransmittance; absorptance; reflectance; irradiance
Self-Recovery Device7x24-hour, 365-day continuous operation; built-in watchdog
Dimensions300 mm × 185 mm × 104 mm
Motion StageX 300mm, Y 300mm, Z 200mm
Wavelength Resolution [Min]2048 channels, 0.3nm spacing (minimum)
Spot size [At 50× Magnification]0.05mm(At 50× Magnification)
Wavelength Repeatability0.1nm
Motion Stage AccuracyX-Y accuracy 1um, repeat positioning accuracy 1um

Key Features

1.Fast full-spectrum reflectance. 2.High-power halogen provides 400-2500nm; Japanese Hamamatsu detector, low-noise precision, 2048 optical channels. 3.Real-time 350-1000NM reflectance/spectra. 4.Spot 5um measures tiny-area transmission/reflection. 5.CIE colors XY, LAB. 6.Analysis/management software with custom schemes. 7.Thin-film reflectance.

Datasheet

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Supplier Information

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Jnewtech
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Shanghai Jiepu Technology Co., Ltd. is a high-tech enterprise with over ten years of experience in spectroscopy. As a leading domestic supplier of spectroscopy R&D, production and integrated solutions, we are committed to the independent R&D and production of domestic spectrometers. Our product line includes micro fiber optic spectrometers, Raman spectrometers, various transmission/reflection optical systems, Raman optical systems, and micro-imaging optical systems. We provide one-stop optical solutions for various industries. Our applications cover environmental water quality and flue gas monitoring, drug testing, public security, jewelry identification, skin quality testing, crop testing, cancer cell testing, new materials testing, etc. With a senior engineering team and cooperation with universities like Fudan and Tongji, we deliver high-performance, cost-effective products and services.

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Microscale Reflectance Measurement System VIS3-200-800
Jnewtech · Optical Metrology
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