Sphere-3000 Reflectance Spectrometer (Sphere-3000 (II) Model)
The Sphere-3000 Reflectance Spectrometer can quickly and accurately measure the relative/absolute reflectance of various spherical/aspherical components. It is suitable for coating surface reflectance measurement of convex lenses, concave lenses, mirrors, etc., and can also perform single-layer film thickness or refractive index measurement with interference fringes. It can be applied to nanometer-level film thickness inspection of silicon crystalline solar panels..
Specification Snapshot
Wavelength Resolution
1 nm
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Overview
The Sphere-3000 Reflectance Spectrometer can quickly and accurately measure the relative/absolute reflectance of various spherical/aspherical components. It is suitable for coating surface reflectance measurement of convex lenses, concave lenses, mirrors, etc., and can also perform single-layer film thickness or refractive index measurement with interference fringes. It can be applied to nanometer-level film thickness inspection of silicon crystalline solar panels..
Specifications
| Parameter | Value |
|---|---|
| Detector | Hamamatsu S10420 back-illuminated 2D-CCD |
| Detection Range | 380~1100 nm |
| Wavelength Resolution | 1 nm |
| Signal-to-noise ratio | 450:1 |
| CCD cooling | Uncooled |
| Repeatability/Measurement Accuracy [380nm~410nm] | ±0.1 % or less (380 nm~410 nm) |
| Repeatability/Measurement Accuracy [410nm~900nm] | ±0.05 % or less (410 nm~900 nm) |
| Wavelength interval | 0.45 nm |
| Measurement Method | Measurement by comparison with a standard |
| Single Measurement Time | <1 s |
| Sample N.A. [when using 10x objective] | 0.12 (when using 10x objective) |
| Sample Size [when using 10x objective] | Diameter >1 mm; Thickness >1 mm (when using 10x objective) |
| Sample Measurement Range [when using 10x objective] | Approx. φ100um (when using 10x objective) |
| Focusing method | Manual/Automatic (MA) selectable, auto-focus time <8 S |
| Equipment Dimensions/Weight [External Light Source] | 310(W)*435(D)*630(H)mm, approx. 22 kg (external light source) |
| Operating Environment | Level and vibration-free location; Temperature: 23±5 °C; Humidity: 60 % or less, no condensation |
| Operating System | Windows7~Windows10 |
| Software | Spectral reflectance, object color, single-layer film thickness (with interference fringes), and coating (with interference fringes) refractive index measurement |
Key Features
1. Eliminates backside reflected light, enabling quick and accurate surface reflectance measurement without backside anti-reflection treatment;; 2. CIE color measurement X Y chromaticity diagram, x, y, L, a, b, saturation, dominant wavelength, etc.;; 3. Microscopic measurement of reflectance in minute areas, with the objective lens focused on the minute area of the measured object (φ60μm).
Datasheet
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Supplier Information
Guangzhou Biaoqi Optoelectronics Technology Development Co., Ltd. was founded in 2005 and is an enterprise founded by leading entrepreneurial talents in Guangzhou Development District. It is a national high-tech enterprise and a national specialized and sophisticated "little giant" enterprise focusing on spectral rapid detection system integration and instrument development. The company integrates design, R&D, manufacturing, sales, and after-sales service, with spectral rapid detection and analysis technology as its core. Through high-speed acquisition, processing, and algorithm analysis of spectral data, it provides rapid, non-destructive, online, fully automatic detection equipment and high-end quality inspection and analysis solutions for various industries. Biaoqi Optoelectronics has established the Guangdong Provincial Engineering Technology Research Center for Rapid Spectral Measurement. Its products cover many fields such as optical component inspection, semiconductors, new energy vehicles, environmental monitoring, solar photovoltaics, new materials, biology, optoelectronics, and chemicals. Relying on strong independent R&D capabilities and independent demonstrative diversified operational advantages, Biaoqi Optoelectronics has achieved rapid development in recent years and is a leader in the domestic spectral rapid detection application industry. It has obtained numerous qualifications and honors, including national specialized and sophisticated "little giant" enterprise, national high-tech enterprise, Guangdong Province specialized and sophisticated enterprise, Guangdong Province intellectual property demonstration enterprise, and Guangzhou Development District gazelle enterprise.
Under the guidance of its core corporate values of "prudent thinking, earnest practice, innovation, and win-win", Biaoqi Optoelectronics continuously accumulates experience, builds a domestic independent brand, and customizes spectral detection application solutions for customers, developing spectral rapid detection and analysis instruments suitable for different application fields. These include the optical component inspection industry: optical component spectral sorting instruments, reflectance spectral analyzers, transmittance spectral analyzers, etc.; the jewelry identification industry: UV-visible spectral analyzers (jewelry detectors), jewelry luminescence imaging analyzers, etc.; and the scientific research field: quantum efficiency spectral analysis systems, portable Raman spectral analyzers, photoluminescence spectral analyzers, etc. Biaoqi Optoelectronics' non-destructive rapid spectral analyzers have significant advantages, featuring high efficiency, speed, and accuracy, which can help users greatly improve detection efficiency and assist the high-quality development of application industries.
At the same time, Biaoqi Optoelectronics is the South China general agent for Ocean Optics, the inventor of micro fiber optic spectrometers, an internationally renowned enterprise.
With the rapid development of science and technology, Biaoqi Optoelectronics keeps pace with technological progress and the development of the times, forging ahead on the road of rapid spectral detection, striving for perfection.
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