JW18001-LIV Laser Chip Test System
The JW18001-LIV laser chip test system is a testing instrument newly developed by Shanghai Jiahui for measuring the voltage-current-power curve parameters of laser chips. It can directly measure laser bare dies and keep the chip in a constant-temperature state. It has been designed in both hardware and software specifically for laser chip testing, and can test LIV, PER, and spectrometer-related parameters. The host device and platform can be moved for testing according to application scenarios, the probe is energized, and the fixture can work with high-low temperature test chambers for high-temperature aging test monitoring. A small water-cooling circulation system can achieve constant-temperature control after high-temperature aging tests, and the fixture has a temperature detection function, improving testing efficiency. The host computer software is powerful and easy to operate, with a simple interface style. It supports automatic threshold determination and graphical display of test data. It can be combined with our JW18001-LDM aging test system to realize a complete aging laser chip testing solution.
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