JW18001 LDM Aging Test System
JW18001—LDM aging test system, aimed at aging process monitoring of laser chips, chips, Bars, bare Dies and COC devices. It adopts a system architecture and separated fixtures for hardware and software design. The main unit is installed in a standard 19-inch cabinet, and the separated fixtures are connected to the main unit through high-temperature wires, creating a real-time controllable aging environment. The interface operation is simple, and data is graphical. Different types of aging test fixtures are designed to suit devices of different packages and sizes. After aging is completed, the fixture can be directly placed as a whole onto the constant-temperature test platform to complete the testing of the device's LIV curve, spectrum and extinction ratio.
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