100G transmission analyser
Handheld structures and ultra-long battery power supply; very easy on-site testing; touch screen, keyboard dual operating model; easy-to-operate SDH; 2 STM-1/4/16/64 light vents; OTN; 2 OTU0/OTU1/OTU2/OTU1e/OTU2e; 1 OTU3/OTU4 OSU-OTN (OSU test interface); 2 OTU0/OTU1/OTU2/OTU2/OTU2e to display histograms of test records; visual clarity to initiate identification functions; full self-test functionality to automatically match the receiving end parameters with the end of the launch; assessment of t
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Overview
Handheld structures and ultra-long battery power supply; very easy on-site testing; touch screen, keyboard dual operating model; easy-to-operate SDH; 2 STM-1/4/16/64 light vents; OTN; 2 OTU0/OTU1/OTU2/OTU1e/OTU2e; 1 OTU3/OTU4 OSU-OTN (OSU test interface); 2 OTU0/OTU1/OTU2/OTU2/OTU2e to display histograms of test records; visual clarity to initiate identification functions; full self-test functionality to automatically match the receiving end parameters with the end of the launch; assessment of the regularity of the instrument test functions of SDH replicating structures conforming to the ITU-T G.707 standard OOTN re-reflective structures conforming to the standards of ITU-T G.709; SDH/PDH error analysis to support G.707, G.826, G.828, G.8, G.8100, M.2100, M.21, M.21, and SD20.21; and SD20/N detection to insert errors. Insertion and monitoring with OSU layers; including CRC, TCM1BIP8, TCM1BEI, TCM2BIP8, TCM2BEI, PMBIP8, PMBEI with OSU layers; and LOF, LOM, TCM1LOM, TCM1BDI, TCM1LTC, TT
Specifications
| Parameter | Value |
|---|---|
| Rate | STM-1/4/16/64 halo; 10/100/1000M, 100M/1000M/10G light, 10G WAN; 40GE/1000GE light, IEEE802.3; OTU0,OTU1,OTU2,OTU1e, OTU2e, OTU3,OTU4 |
| Clock Offset | ± 200 ppm, step 0.1 ppm; ±200ppm, 0.1 ppm long, internal clock, external clock and line extraction clock |
| Netload Map | E1,E3,E4,PRBS; PRBS, STM-1/STM-4, GE/10GE, MAC rate, etc. OTU0<-ODU0<-OSBS, ETH, SDH OTU1<-OSU<-PRBS, ETH, SDH OTU2<-OSU<-PRBS, ETH, SDHOTU2<-OSU<-PRBS, SDHOTU2e<-ODU2e<-OSU<-PRBS, ETH ODUFTX.ts (N1.25G) <-OSU<-PRBS, ETH |
| Graphics | PRBS: 2E9, 2E11, 2E15, 2E20, 2E23 Other: 1010,1000, all 0, all 1,16 bits to edit |
| Interface | STM-1/4/16/64 SGP+; Light SFP+ |
| In error code insertion and measurement | Frame error code, B2\BIP-2\MS-REI\HP-REI\LP-REI HP-IEC, expense error code; The OTUk Layer: FAS, MFAS; OTUk Sector Surveillance (SM) Costs: BIP-8, BEI/BIAE; ODUk Channel Surveillance (PM) Costs: BIP-8, BEI; ODUk Serial Connectivity Surveillance (TCM1-6): BIP-8, BEI/BIAE; OSU Level: CRC, TC1BIP8, TC1BEI, TCM2BIP8, TCM2BEI, PMBIP8, PMBEI; OPUk: Bit Error Number; FEC: Corredederated Erororbit, USC block |
| Warning generation and measurement | LOS\LOF\OOF\MS-AIS\MS-RDI\HP-AIS\AU-LOP HP-RDI\TU-AIS\LP-RDI; Port: LOS OTU Level: SM-BDI, SM-IAE, SM-TIM, SM-BIAE etc.; ODU Level (including PM and TCM): ODU-AI, ODU-OCI, ODU-LCK; ODU-TCM1 ~6: BDI, IAE, TIM, LTC, BIAE; ODU Level: PM: BDI, TIM; OSU Level: LOF, LOM, TCM1LOM, TCM1BDI, TCM1LTC, TCM2BDI, TCM2LTC, PMLOM, PMBDI, LOPB, AIS, OCI, LCK; OPU Level: PLM, Pattern LOSS/LSSS |
| Malcode Performance Analysis | ITU-T G.707\G.821\G.826\G.828\M.2100\M.2110\M.2120; M.2120 |
| Frequency measurements | Measurement of recovery clock frequency of receiving signal, resolution: 1Hz accuracy: ±4.6 ppm |
| Pointer Settings | Sudden pointer, new pointer, G.783 sequence, clock shift |
| Pointer Test | Pointer value, number of positive/negative adjustments, adjustment seconds, NDF seconds, NDF lost seconds, VC offset |
| Cost setting and monitoring | Part cost: available except for B1, B2 and pointers to monitor all expenses You can set it up except for B3. You can monitor all expenses; All bytes except bytes that are not editable |
| Test Interface | OTU0,OTU1,OTU2,OTU2e |
| Loop Back timed test | Test range 0-50s, test accuracy 0.01 ms |
| Test | Support all alarms and miscalculations |
| No-lost bandwidth adjustment test | Settings: Default bandwidth, adjustment bandwidth, adjustment time Test function: No BW Inc Ack, No BW Dec Ack, No BW Inc Confilm Ack, Has Bw Inc Ack failed simulation works on the host; No BW Inc Confilm Req failed simulation works on the source |
| Miscode Test | An error test on 1st to 4th floor, frame length 64-15000 bytes |
| RFC 2544 Test | Swallow volume, time delay, frame lost, back to back. 12 frame length tests |
| Y.1564 test | Configuration and performance tests, 256 operations, CIR/EIR, etc |
| Spam analysis test | 256 stream generation and analysis tests |
| Layer | IPv4 and IPv6 |
| RFC6349 Test | RFC6349 TCP spam test function |
| Other | VLAN, PING, routing, grab bag analysis, MPLS |
| Operation Interface | Chinese, English |
| Other interfaces | 3 USB interfaces, 1 RJ45 interface |
| Power adapter | 160-240v, 4A |
Datasheet
Product Datasheet
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Supplier Information
Wuhan OVLink Interconnection Technology Co., Ltd. (abbreviated as "OVLink") is located in Future Science City, East Lake National Independent Innovation Demonstration Zone, Wuhan, China. With a registered capital of 10 million RMB, it was founded in 2013 by a technical team from Huazhong University of Science and Technology. The company is an enterprise of Optics Valley "3551 Talents", a gazelle enterprise, a specialized and innovative enterprise in Hubei Province, and a national high-tech enterprise. Through continuous technological innovation, the company provides cost-effective test instruments and services for optical communication and optical sensing users. Its products cover high-speed optical module testing, high-speed coherent optical communication, fiber grating processing and testing, semiconductor laser control and light sources, distributed optical fiber sensing components and systems, etc. It not only provides cost-effective test instruments, but also provides module-level and system-level customized development services.
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