Coupler Comprehensive Test System
Product Function Introduction 1. One-time connection, simultaneously performing full-bandwidth scanning tests and single-point IL, PDL, RL, DIR tests, supporting high/low temperature testing. 2. One-drives-four shared broadband light source and OSA spectrum analyzer, saving hardware costs. 3. Compatible with 1X2, 2X2, 1X4 Coupler products and WDM device testing, automatically testing and calculating IL, WDL, PDL, RL, DIR, UL, TDL and other parameters. 4. Automatically judges test results; all data is stored in bulk in the SQL Server database, and shipping reports are automatically generated in batches. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators ITU IL/Min IL/Max IL/WDL/Ripple/TDL and other parameters Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) Measurement mode OSW scan Single-channel scan time 6-8 (AQ6370, 1250~1650nm, step 0.1nm) s
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Overview
Specifications
| Parameter | Value |
|---|---|
| Test Specifications | ITU IL/Min IL/Max IL/WDL/Ripple/TDL and other parameters |
| Insertion Loss (IL) Uncertainty | ±0.05 (fusion splice test); ±0.1 (connector test) |
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