Coupler Comprehensive Test System

Coupler Comprehensive Test System

Supplier
Szbrightas
Category
Posts and Post Holders
Origin
China

Product Function Introduction 1. One-time connection, simultaneously performing full-bandwidth scanning tests and single-point IL, PDL, RL, DIR tests, supporting high/low temperature testing. 2. One-drives-four shared broadband light source and OSA spectrum analyzer, saving hardware costs. 3. Compatible with 1X2, 2X2, 1X4 Coupler products and WDM device testing, automatically testing and calculating IL, WDL, PDL, RL, DIR, UL, TDL and other parameters. 4. Automatically judges test results; all data is stored in bulk in the SQL Server database, and shipping reports are automatically generated in batches. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators ITU IL/Min IL/Max IL/WDL/Ripple/TDL and other parameters Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) Measurement mode OSW scan Single-channel scan time 6-8 (AQ6370, 1250~1650nm, step 0.1nm) s

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Overview

Product Function Introduction 1. One-time connection, simultaneously performing full-bandwidth scanning tests and single-point IL, PDL, RL, DIR tests, supporting high/low temperature testing. 2. One-drives-four shared broadband light source and OSA spectrum analyzer, saving hardware costs. 3. Compatible with 1X2, 2X2, 1X4 Coupler products and WDM device testing, automatically testing and calculating IL, WDL, PDL, RL, DIR, UL, TDL and other parameters. 4. Automatically judges test results; all data is stored in bulk in the SQL Server database, and shipping reports are automatically generated in batches. Test Interface Diagram System Performance Specifications Parameter Specification Unit Min Typ Max Operating wavelength 1260 1620 nm Test indicators ITU IL/Min IL/Max IL/WDL/Ripple/TDL and other parameters Insertion loss (IL) uncertainty ±0.05 (fiber splicing test) dB ±0.1 (connector test) Measurement mode OSW scan Single-channel scan time 6-8 (AQ6370, 1250~1650nm, step 0.1nm) s

Specifications

ParameterValue
Test SpecificationsITU IL/Min IL/Max IL/WDL/Ripple/TDL and other parameters
Insertion Loss (IL) Uncertainty±0.05 (fusion splice test); ±0.1 (connector test)

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Supplier Information

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Szbrightas
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Shenzhen Brightas Communication Equipment Co., Ltd. was established in 2012. It is a national high-tech enterprise and municipal specialized and sophisticated enterprise focusing on the R&D, production and sales of automation equipment for optical communication device modules. Core products include precision automatic coupling equipment and automatic testing solutions, mainly serving silicon photonics/TFLN waveguide chips, 800G and above optical modules, lasers, AWG, CPO pluggable components, etc. It also provides optical module and optical device testing instruments (light sources, optical attenuators, optical power meters, optical switches, polarization controllers, etc.). The company's partners are spread across many leading domestic silicon photonics chip, optical module and upstream component enterprises.

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Coupler Comprehensive Test System
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