White Light Interferometer AM-7000 Series

White Light Interferometer AM-7000 Series

Supplier
Atometrics
Category
Interferometers
Origin
China

AM-7000 can be used for sub-nanometer measurement of various precision devices and material surfaces, acquiring surface 3D topography in the form of a "surface", and processing and analyzing the 3D topography through dedicated software, with RMS repeatability up to 0.002nm.; AM-7000 is equipped with long-travel high-speed nano piezoelectric ceramic devices, with a maximum scanning speed of 400um/s and 3200Hz, combined with the industry-first SST+GAT algorithm, instantly completing up to 5 million point cloud acquisition.

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Overview

AM-7000 can be used for sub-nanometer measurement of various precision devices and material surfaces, acquiring surface 3D topography in the form of a "surface", and processing and analyzing the 3D topography through dedicated software, with RMS repeatability up to 0.002nm.; AM-7000 is equipped with long-travel high-speed nano piezoelectric ceramic devices, with a maximum scanning speed of 400um/s and 3200Hz, combined with the industry-first SST+GAT algorithm, instantly completing up to 5 million point cloud acquisition.

Specifications

ParameterValue
Accuracy0.03nm
Scan Speed400um/s
Maximum Point Cloud Acquisition5 million points

Applications

Roughness, Micro-topography, Step Height, Flatness; Application Examples: Roughness Grinding Marks-Roughness Mica-Surface Topography Roughness Flank Face-Roughness Rake Face-Roughness Lens-Roughness Gear Splicing-Roughness Metal-Surface Texture Roller-Surface Roughness Copper Foil-Roughness Implant-Roughness/Topography Dimensions Intraocular Lens-Roughness/Topography Dimensions Copper Foil-Roughness Gyroscope Lens-Roughness Wafer-Roughness Phone Cover Glass-Roughness Measurement Precision Polishing-Roughness HUD Glass-Roughness Gear-Surface Roughness Laser-machined Parts-Topography/Surface Roughness Optical Module Liquid-cooling Plate-3D Topography/Surface Roughness PCR Tube-Inner Wall Roughness Denture-3D Profile/Surface Roughness Ultra-smooth Lens-Surface Roughness 3D Printed Metal Samples-Surface Roughness 3D Printed Aspherical Lens-Surface Roughness; Height/Height Difference OLED-Surface Dimensions PV Grid Lines-Height; 3D Topography PCB Dimensions-3D Topography Capacitor Component Surface-3D Topography Phone Glass Cover Scratches-3D Topography Bumping-3D Topography Wafer Surface Etching-3D Topography Wafer Etching-3D Topography Wafer Cutting Depth-3D Topography Photomask-3D Topography Lens Mold-3D Topography Microlens Compound Eye-3D Topography Cylindrical Lens-3D Topography Float Glass-Surface 3D Topography Optical Flat Mirror-Roughness Silicon Wafer-Surface Pyramid Structure Laser Line Depth-3D Topography Metal Grid Lines-3D Topography Microfluidics-Topography Dimensions Phone Switch-Topography Dimensions Nanoimprint-Topography Dimensions Laser Processing-Topography Dimensions MEMS Devices-Topography Dimensions Micro-motion Friction-Friction Volume Plow Grooves-Area Measurement Wafer-Depth/Height Difference/Roughness LIBS Ablation Crater-Topography Depth/Volume/Step Microlens Array-Micro 3D Topography Perovskite Solar Cell-Roughness/Topography Analysis Diamond Wafer-Surface Roughness, Flatness Microfluidic Chip-Surface Roughness/Micro-channel Height and Width Alloy Spacer-3D Topography Fresnel Lens-Radius of Curvature/Surface Figure PV Value; 2D Dimensions Chip-2D Dimensions Glass Substrate-TGV Hole Dimensions; Flatness Wafer-Flatness Ceramic Substrate-Flatness Periscope-Flatness; Thickness Perovskite-Coating Thickness; Step Height Step-Height Height Difference-Chip Height Measurement Height Difference-Character Depth PCB Gold Fingers PCB Blind Vias-Step Height Metal Parts-Topography/Step Metal Spacer-Step Height/Topography; 2D Profile Cylindrical Lens Array-2D Profile Fresnel Lens-Angle; Defect Analysis Lens-Scratch Measurement; Foreign Particle Analysis Lens-Foreign Particle Measurement

Datasheet

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Supplier Information

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Atometrics
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Banshi Intelligent Technology (Shenzhen) Co., Ltd. (brand: Atometrics) was established in 2017, headquartered in Shenzhen. It is a national-level specialized and sophisticated 'Little Giant' enterprise and a high-tech enterprise, focusing on high-precision measuring instruments and semiconductor metrology and inspection equipment. The company has launched various high-precision measurement products such as white light interferometers, flash measuring instruments, super depth-of-field microscopes, laser sensors, spectral confocal sensors, wafer 3D metrology equipment, etc., which are widely used in semiconductors, aerospace, 3C electronics, 5G communication, new energy, biomedical and other fields. Major customers include Huawei HiSilicon, CATL, Chinese Academy of Sciences, and other well-known enterprises, committed to exploring the future of humanity with precision measurement.

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White Light Interferometer AM-7000 Series
Atometrics · Interferometers
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