Low-Capacitance Large-Area InGaAs PIN Photodiode Chip Series OVQT-LC1.5x6
The low-capacitance large-area InGaAs PIN photodiode chip series uses a front-illuminated planar
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Overview
Specifications
| Parameter | Value |
|---|---|
| Response Time - Test Condition: standard | Typ 45ns |
| -3 dB Bandwidth - Test Condition: standard | Typ 10MHz |
| Reverse Breakdown Voltage - Test Condition: standard | Min 10V |
| Dark Current - Test Condition: standard | Typ 30nA |
| Response Time - Test Condition: low capacitance | Typ 22ns |
| -3 dB Bandwidth - Test Condition: low capacitance | Typ 20MHz |
| Reverse Breakdown Voltage - Test Condition: low capacitance | Min 10V |
| Dark Current - Test Condition: low capacitance | Typ 100nA |
| Capacitance - Test Condition: standard, 1V | Typ 1100pF |
| Capacitance - Test Condition: low capacitance, 1V | Typ 520pF |
| Capacitance - Test Condition: standard, 2V | Typ 960pF |
| Capacitance - Test Condition: low capacitance, 2V | Typ 380pF |
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Datasheet
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