EM-8010/EM-8020 Scanning Electron Microscope
The EM-8010 and EM-8020 are advanced scanning electron microscopes designed for high-resolution imaging and analysis in various scientific and industrial applications.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Resolution | 1.0nm (EM-8010), 0.8nm (EM-8020) |
| Acceleration Voltage | 0.5-30kV |
| Magnification | ×10-×1,000,000 |
| Sample Stage Movement Range | X: 100mm, Y: 100mm, Z: 50mm, Tilt: -10° to +90°, Rotation: 360° |
| Detector type | Secondary Electron Detector |
| Detector type | Backscattered Electron Detector |
| Vacuum System | Turbo Molecular Pump, Oil-Free Pump |
| Electron Gun Type | Thermionic Emission Gun (EM-8010), Field Emission Gun (EM-8020) |
| Sample Size | Up to 150mm diameter |
| Image Resolution | High-resolution imaging up to 1.0nm (EM-8010), 0.8nm (EM-8020) |
| Operating System | Windows-based software |
Applications
Key Features
Datasheet
Supplier Information
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