HP-001 Ultra High Power Probe
The HP-001 Ultra High Power Probe is designed for high voltage and current testing, featuring a robust design and high-temperature resistance.
Specification Snapshot
Cable Length
1m
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Overview
The HP-001 Ultra High Power Probe is designed for high voltage and current testing, featuring a robust design and high-temperature resistance.
Specifications
| Parameter | Value |
|---|---|
| Maximum Voltage | 10000V DC @200°C, 8000V @300°C |
| Maximum Current | 300A pulse (withstand maximum 600A pulse)/20A DC |
| Temperature Range | -60°C~300°C |
| Interface Type | High Voltage Banana (4mm) |
| Cable Length | 1m |
| Compatible Equipment Type | Dedicated positioning device |
| Contact Resistance | <0.05mΩ (12 fingers, Au pad), <0.20mΩ (8 fingers, Au pad), <0.50mΩ (4 fingers, Au pad), <1.00mΩ (1 finger, Au pad) |
| Probe Insulation Resistance | >10TΩ @25°C (Chuck temperature), >3TΩ @200°C (Chuck temperature), >1TΩ @300°C (Chuck temperature) |
| Tip Material | Gold |
| Overtravel | 125~250μm, ~150μm @300μm overtravel |
| Tip Size | ≤250μm |
| Tip Pitch | 650μm |
Applications
1. Semiconductor testing 2. High voltage circuit testing 3. Power electronics testing
Key Features
1. Ultra high power probe with maximum voltage of 10kV and current of 300A pulse/20A DC 2. High voltage Banana (4mm) interface 3. Wide temperature range: -60°C~300°C 4. High reliability and durability 5. Compatible with dedicated positioning devices
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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