B-001 Direct Current Probe
The B-001 Direct Current Probe is designed for precise temperature testing and electrical measurements, offering reliable performance across a wide range of applications.
Specification Snapshot
Frequency Range
DC~100MHz
Maximum DC Voltage
500V
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Overview
The B-001 Direct Current Probe is designed for precise temperature testing and electrical measurements, offering reliable performance across a wide range of applications.
Specifications
| Parameter | Value |
|---|---|
| Frequency Range | DC~100MHz |
| Testing Temperature | -60°C~300°C |
| Characteristic Impedance | 50Ω |
| Maximum DC Voltage | 500V |
| Interface Type | Mini Triax (female) |
| Application Range | I-V/C-V |
Applications
1. Temperature testing in extreme conditions 2. Electrical measurements for I-V and C-V analysis
Key Features
1. Operates in a wide temperature range from -60°C to 300°C 2. Supports 4-wire Kelvin measurement 3. Provides excellent shielding performance for I-V and C-V measurements
Datasheet
Product Datasheet
PDF
Supplier Information
<p>Suzhou Yiulu System Integration Co., Ltd. is a high-tech company dedicated to on-chip testing and measurement of semiconductor wafers. The company's main businesses are as follows: selling device components and complete equipment in the field; providing wafer-level test integration solutions; and providing future series semiconductor test system integration software. The Eoulu laboratory has the independently developed F1 probe platform system, which can provide customers with a full set of test and measurement services including DC/RF/Hi Power/silicon photonics/PCB board testing; the F1 probe platform system is a probe platform system that can evolve and learn, and has a new digital</p>
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