Thickness Mapping System TMS-2000
The TMS-2000 is a high-precision thickness mapping system designed for advanced optical measurement applications. It provides accurate and reliable thickness data for various materials.
Specification Snapshot
Sample Size
Up to 200mm diameter
Data Interface
USB
Data Interface
Ethernet
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Overview
The TMS-2000 is a high-precision thickness mapping system designed for advanced optical measurement applications. It provides accurate and reliable thickness data for various materials.
Specifications
| Parameter | Value |
|---|---|
| Measurement Range | 0-200μm |
| Measurement Accuracy | ±0.1μm |
| Measurement Speed | Up to 100 points/sec |
| Sample Size | Up to 200mm diameter |
| Data Interface | USB |
| Data Interface | Ethernet |
| Operating System | Windows 10 |
Applications
1. Semiconductor wafer thickness measurement 2. Optical component quality control 3. Material research and development
Key Features
1. High precision and accuracy 2. Fast measurement speed 3. User-friendly interface 4. Wide compatibility with various sample sizes
Datasheet
Product Datasheet
PDF
Supplier Information
<p><span style="color: rgb(15, 17, 21); background-color: rgb(255, 255, 255); font-size: 16px;">Santec (Shanghai) Co., Ltd., a wholly-owned subsidiary of Japan's Santec Holdings, was established in Pudong, Shanghai in 2001. It specializes in optical communications, testing instruments, and optical imaging, offering tunable lasers, optical components, and OCT systems. The company provides advanced optical measurement and sensing solutions to the Chinese market.</span></p>
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