Thickness Mapping System TMS-2000

Thickness Mapping System TMS-2000

Supplier
Santec
Part Number
Thickness Mapping System TMS-2000
Category
Size Measurement
Origin
China

The TMS-2000 is a high-precision thickness mapping system designed for advanced optical measurement applications. It provides accurate and reliable thickness data for various materials.

Specification Snapshot
Sample Size
Up to 200mm diameter
Data Interface
USB
Data Interface
Ethernet
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Overview

The TMS-2000 is a high-precision thickness mapping system designed for advanced optical measurement applications. It provides accurate and reliable thickness data for various materials.

Specifications

ParameterValue
Measurement Range0-200μm
Measurement Accuracy±0.1μm
Measurement SpeedUp to 100 points/sec
Sample SizeUp to 200mm diameter
Data InterfaceUSB
Data InterfaceEthernet
Operating SystemWindows 10

Applications

1. Semiconductor wafer thickness measurement 2. Optical component quality control 3. Material research and development

Key Features

1. High precision and accuracy 2. Fast measurement speed 3. User-friendly interface 4. Wide compatibility with various sample sizes

Datasheet

Product Datasheet
PDF
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Supplier Information

Sa
Santec
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<p><span style="color: rgb(15, 17, 21); background-color: rgb(255, 255, 255); font-size: 16px;">Santec (Shanghai) Co., Ltd., a wholly-owned subsidiary of Japan's Santec Holdings, was established in Pudong, Shanghai in 2001. It specializes in optical communications, testing instruments, and optical imaging, offering tunable lasers, optical components, and OCT systems. The company provides advanced optical measurement and sensing solutions to the Chinese market.</span></p>

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