NOVA-2000
The NOVA-2000 is a high-performance defect inspection system designed for precise and efficient detection of defects in various materials and surfaces.
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Overview
The NOVA-2000 is a high-performance defect inspection system designed for precise and efficient detection of defects in various materials and surfaces.
Specifications
| Parameter | Value |
|---|---|
| Inspection Speed | High |
| Defect Detection Capability | Micron-level |
| System Dimensions | Compact |
| User Interface | Touchscreen |
| Data Analysis | Advanced software integration |
Applications
1. Semiconductor manufacturing 2. Quality control in industrial production 3. Research and development in material science
Key Features
1. High precision defect detection 2. User-friendly interface 3. Compact design 4. Advanced data analysis capabilities
Datasheet
Product Datasheet
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Supplier Information
<p>Founded in 2012 in Hefei by returning overseas talents and local entrepreneurs, Zc-Hightech focuses on optical and optoelectronic technologies to develop high-end opto-mechatronic instruments and equipment. As a national high-tech enterprise and Anhui provincial specialized enterprise, it hosts multiple R&D platforms including a provincial key laboratory for ultra-smooth surface nondestructive testing. The company specializes in optical defect inspection equipment for industrial applications, semiconductor wafer inspection, and scientific instruments, with 158 authorized patents.</p>
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