NOVA-2000-G

NOVA-2000-G

Supplier
ZcHightech
Part Number
NOVA-2000-G
Category
Optical Inspection
Origin
China

The NOVA-2000-G is an advanced defect inspection system designed for high-precision and efficient detection of defects in various materials and surfaces.

Specification Snapshot
Dimensions
Standard industrial size
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Overview

The NOVA-2000-G is an advanced defect inspection system designed for high-precision and efficient detection of defects in various materials and surfaces.

Specifications

ParameterValue
Detection AccuracyHigh precision
Detection SpeedFast
Supported Material TypesVarious materials
Operation InterfaceUser-friendly interface
DimensionsStandard industrial size
Power RequirementsStandard industrial power supply
Data Processing CapabilityHigh-speed processing

Applications

1. Semiconductor manufacturing 2. Quality control in industrial production 3. Research and development in material science

Key Features

1. High precision defect detection 2. User-friendly operation interface 3. High-speed data processing 4. Versatile material compatibility

Datasheet

Product Datasheet
PDF
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Supplier Information

Zc
ZcHightech
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<p>Founded in 2012 in Hefei by returning overseas talents and local entrepreneurs, Zc-Hightech focuses on optical and optoelectronic technologies to develop high-end opto-mechatronic instruments and equipment. As a national high-tech enterprise and Anhui provincial specialized enterprise, it hosts multiple R&D platforms including a provincial key laboratory for ultra-smooth surface nondestructive testing. The company specializes in optical defect inspection equipment for industrial applications, semiconductor wafer inspection, and scientific instruments, with 158 authorized patents.</p>

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