Terahertz Attenuated Total Reflection Probe TA-ATR
Innovative ATR Mode Tests Small Powder Amounts or Liquid Spread on Surface;TA-ATR THz Attenuated-Total-Reflection Probe,THz-TDS Scanning Imaging/Fingerprint Spectra/Line Scans
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Overview
Specifications
| Parameter | Value |
|---|---|
| Compatible Host Models | A-TDS-SEP、TA-TDS-MOD |
| Measurement Mode | Attenuated Total Reflection Spectroscopy |
| Crystal Material | High-Resistivity Silicon |
| Crystal Structural Dimensions [Independent Technical Table, No Matching Mechanical Drawing] | Standard Dimensions: Trapezoidal Structure, Base Angle 60°, Surface Length 36mm, Surface Width 15mm; Custom Dimensions Available |
| Crystal Mounting Method | Magnetic Fixing and Cylindrical Pin Positioning; Crystal Removable for Cleaning |
| Measurable Sample Range [Terahertz Band] | Maximum Measurable Sample Refractive Index 3.18 |
| Integrated Scanning Stage Operating Mode | Move to Specified Position, Linked Motion, Jogging |
Datasheet
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Supplier Information
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TA-RP45-OAP and TA-RP45-TPX use incidence at 45° to the incident surface. Their integrated, compact design is portable and space-saving. They can be mounted on a translation stage to scan samples or used as handheld devices for security applications. Terahertz reflection measurement probes TA-RP45-OAP and TA-RP45-TPX; THz-TDS terahertz probes; scanning imaging, spectral lines, fingerprint spectra and spectral-line scanning. The supplied description also lists 90° and 45 degrees.
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Terahertz 45° Reflection Probe TA-RP45-TPX
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Compatible Host Models [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX]: A-TDS-SEP、TA-TDS-MOD Measurement Mode [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX]: Reflection Spectroscopy, Reflection Imaging Reflection Angle [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX]: 45 °
TA-RP45-OAP and TA-RP45-TPX use incidence at 45° to the incident surface. Their integrated, compact design is portable and space-saving. They can be mounted on a translation stage to scan samples or used as handheld devices for security applications. Terahertz reflection measurement probes TA-RP45-OAP and TA-RP45-TPX; THz-TDS terahertz probes; scanning imaging, spectral lines, fingerprint spectra and spectral-line scanning. The supplied description also lists 90° and 45 degrees.
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Compatible Host Models [Explicit Model TA-RP15 in Parameter Image]: A-TDS-SEP、TA-TDS-MOD Measurement Mode [Explicit Model TA-RP15 in Parameter Image]: Reflection Spectroscopy, Reflection Imaging Reflection Angle [Parameter Figure Explicitly Specifies Model TA-RP15; Angle between Incident Beam and Sample Normal]: 7.5 °
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