Terahertz 45° Reflection Probe TA-RP45-OAP
TA-RP45-OAP and TA-RP45-TPX use incidence at 45° to the incident surface. Their integrated, compact design is portable and space-saving. They can be mounted on a translation stage to scan samples or used as handheld devices for security applications. Terahertz reflection measurement probes TA-RP45-OAP and TA-RP45-TPX; THz-TDS terahertz probes; scanning imaging, spectral lines, fingerprint spectra and spectral-line scanning. The supplied description also lists 90° and 45 degrees.
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Overview
Specifications
| Parameter | Value |
|---|---|
| Compatible Host Models [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX] | A-TDS-SEP、TA-TDS-MOD |
| Measurement Mode [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX] | Reflection Spectroscopy, Reflection Imaging |
| Reflection Angle [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX] | 45 ° |
| Focal Length [Common Models in Parameter Image: TA-RP45-OAP, TA-RP45-TPX] | 50.8 mm |
Datasheet
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Supplier Information
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TA-RP45-OAP and TA-RP45-TPX use incidence at 45° to the incident surface. Their integrated, compact design is portable and space-saving. They can be mounted on a translation stage to scan samples or used as handheld devices for security applications. Terahertz reflection measurement probes TA-RP45-OAP and TA-RP45-TPX; THz-TDS terahertz probes; scanning imaging, spectral lines, fingerprint spectra and spectral-line scanning. The supplied description also lists 90° and 45 degrees.
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